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    Untitled

    Abstract: No abstract text available
    Text: 123456789123456789 5 5 9 9 1 1 1 123456789ABC5DEF5A2A795A5 DEF5A357A795 5 123456789A46B8C95D9EF83428C9FACD99A4399 9E5C8A9439995D99 !9E56435D9 97"7487#8C9439$%95D9!&9462F3A9 %"7487#8C9439'D7 #78895D9'5F279E5FAC9


    Original     		PDF 123456789ABC5DEF5 123456789A46B8C95D9EF83428C9FACD9 9E56435D9 9462F3A9 78895D9 35DA9 5E2734 529C5 3DCA58F34569E56435D9 B51234E

    M1014

    Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
    Text: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS


    Original     		PDF AT-27C256R from27C256R 4B0691 8703A) M1014 K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352