50n50
Abstract: 55N50 150N50 IXFK55N50
Text: VDSS HiPerFETTM Power MOSFETs ISOPLUS247TM IXFR 50N50 IXFR 55N50 Electrically Isolated Back Surface ID25 RDS(on) Ω 100 mΩ Ω 90 mΩ 500 V 43 A 500 V 48 A trr ≤ 250 ns Single Die MOSFET Maximum Ratings ISOPLUS 247TM Symbol Test Conditions VDSS VDGR
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ISOPLUS247TM
50N50
55N50
247TM
IXFK55N50
50N50
55N50
150N50
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Untitled
Abstract: No abstract text available
Text: VDSS HiPerFETTM Power MOSFETs ISOPLUS247TM IXFR 50N50 IXFR 55N50 Electrically Isolated Back Surface ID25 RDS(on) Ω 100 mΩ Ω 90 mΩ 500 V 43 A 500 V 48 A trr ≤ 250 ns Single Die MOSFET Symbol Test Conditions Maximum Ratings VDSS VDGR TJ = 25°C to 150°C
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ISOPLUS247TM
50N50
55N50
IXFK55N50
50N50
55N50
728B1
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ixys ixfn 55n50
Abstract: 50n50 IXFK50N50 IXFN50N50 IXFK55N50 IXFN55N50
Text: HiPerFETTM Power MOSFET IXFN IXFN IXFK IXFK Single Die MOSFET 55N50 50N50 55N50 50N50 VDSS ID25 RDS on 500V 500V 500V 500V 55A 50A 55A 50A 80mΩ 100mΩ 80mΩ 100mΩ trr 250ns 250ns 250ns 250ns Preliminary data sheet Symbol Test Conditions TO-264 AA (IXFK)
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55N50
50N50
250ns
O-264
ixys ixfn 55n50
50n50
IXFK50N50
IXFN50N50
IXFK55N50
IXFN55N50
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50n50
Abstract: No abstract text available
Text: HiPerFETTM Power MOSFETs ISOPLUS247TM VDSS IXFR 50N50 IXFR 55N50 Electrically Isolated Back Surface ID25 500 V 43 A 500 V 48 A trr £ 250 ns RDS(on) 100 mW 80 mW Single MOSFET Die Preliminary data Symbol Test Conditions VDSS VDGR T J = 25°C to 150°C T J = 25°C to 150°C; RGS = 1 MW
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ISOPLUS247TM
50N50
55N50
55N50
247TM
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AWCCA-50N50
Abstract: No abstract text available
Text: Wireless Charging Coil Assembly AWCCA-50N50 Pb RoHS / RoHS II Compliant 50 x 50mm Moisture Sensitivity Level MSL – MSL = 1 FEATURES: • Wireless Charging Coil for Transmitter or Receiver applications, (6.3 H & 24μH options) • Outline Dimensions: 50mm x 50mm, height options 3.5mm,
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AWCCA-50N50
ISO9001
AWCCA-50N50
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Untitled
Abstract: No abstract text available
Text: HiPerFETTM Power MOSFET VDSS IXFE 55N50 IXFE 50N50 Single Die MOSFET ID25 RDS on Ω 90 mΩ Ω 100 mΩ 500 V 50 A 500 V 47 A trr ≤ 250 ns Preliminary data sheet ISOPLUS 227TM (IXFE) Symbol Test Conditions Maximum Ratings VDSS VDGR TJ = 25°C to 150°C
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55N50
50N50
227TM
IXFN55N50
IXFE55N50:
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ixys ixfn 55n50
Abstract: ixys ixfn55n50 IXFK50N50
Text: HiPerFETTM Power MOSFET IXFN 55N50 IXFN 50N50 IXFK 55N50 IXFK 50N50 Single MOSFET Die VDSS I D25 RDS on t rr 500V 500V 500V 500V 55A 80mW 250ns 50A 100mW 250ns 55A 80mW 250ns 50A 100mW 250ns Preliminary data sheet Symbol Test Conditions TO-264 AA (IXFK) Maximum Ratings
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55N50
50N50
50N50
250ns
100mW
ixys ixfn 55n50
ixys ixfn55n50
IXFK50N50
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fast IXFX
Abstract: ixf55n50 50N50 IXFX55N50 125OC PLUS247TM 55N50
Text: HiPerFETTM Power MOSFETs VDSS ID25 RDS on 500 V 50 A 100 mΩ Ω Ω 500 V 55 A 80 mΩ trr ≤ 250 ns IXFX 50N50 IXFX 55N50 Single Die MOSFET Preliminary data sheet Symbol Test Conditions Maximum Ratings V DSS VDGR TJ = 25°C to 150°C TJ = 25°C to 150°C; RGS = 1 MΩ
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50N50
55N50
247TM
125OC
fast IXFX
ixf55n50
50N50
IXFX55N50
125OC
PLUS247TM
55N50
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50n50
Abstract: IXFN55N50 IXFE50N50 IXFE55N50 55n50
Text: HiPerFETTM Power MOSFET VDSS IXFE 55N50 IXFE 50N50 Single Die MOSFET ID25 RDS on Ω 90 mΩ Ω 100 mΩ 500 V 50 A 500 V 47 A trr ≤ 250 ns Preliminary data sheet ISOPLUS 227TM (IXFE) Symbol Test Conditions Maximum Ratings VDSS VDGR TJ = 25°C to 150°C
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55N50
50N50
227TM
IXFN55N50
IXFE55N50:
50n50
IXFE50N50
IXFE55N50
55n50
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50N50
Abstract: IXFE50N50 IXFE55N50 IXFN55N50
Text: HiPerFETTM Power MOSFET VDSS IXFE 55N50 IXFE 50N50 Single Die MOSFET ID25 RDS on Ω 80 mΩ Ω 100 mΩ 500 V 52 A 500 V 47 A trr ≤ 250 ns Preliminary data sheet ISOPLUS 227TM (IXFE) Symbol Test Conditions Maximum Ratings VDSS VDGR TJ = 25°C to 150°C
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55N50
50N50
227TM
3000VSD
IXFN55N50
IXFE55N50:
50N50
IXFE50N50
IXFE55N50
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Untitled
Abstract: No abstract text available
Text: HiPerFETTM Power MOSFETs ISOPLUS247TM VDSS IXFR 50N50 IXFR 55N50 Electrically Isolated Back Surface ID25 500 V 43 A 500 V 48 A trr £ 250 ns RDS(on) 100 mW 80 mW Single MOSFET Die Preliminary data Symbol Test Conditions VDSS VDGR TJ = 25°C to 150°C TJ = 25°C to 150°C; RGS = 1 MW
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ISOPLUS247TM
50N50
55N50
55N50
247TM
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50N60
Abstract: 50n50 ixgk50n60bu1 G 50N60 50n5 IXGH50N60B
Text: HiPerFASTTM IGBT with Diode V CES IXGK 50N50BU1 IXGK 50N60BU1 I C25 500 V 75 A 600 V 75 A V CE sat t fi 2.3 V 2.5 V 100ns 120ns Combi Pack Preliminary data Symbol Test Conditions Maximum Ratings 50N50 50N60 VCES VCGR T J = 25°C to 150°C T J = 25°C to 150°C; RGE = 1 MW
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100ns
120ns
50N50BU1
50N60BU1
50N50
50N60
O-264
IXGK50N50BU1
IXGK50N60BU1
ixgk50n60bu1
G 50N60
50n5
IXGH50N60B
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55n50
Abstract: ixys ixfn 55n50 IXFK50N50
Text: HiPerFETTM Power MOSFET IXFN 55N50 IXFN 50N50 IXFK 55N50 IXFK 50N50 Single MOSFET Die VDSS I D25 RDS on t rr 500V 500V 500V 500V 55A 80mW 250ns 50A 100mW 250ns 55A 80mW 250ns 50A 100mW 250ns Preliminary data sheet Symbol Test Conditions TO-264 AA (IXFK) Maximum Ratings
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55N50
50N50
50N50
250ns
100mW
ixys ixfn 55n50
IXFK50N50
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50N60
Abstract: G 50N60 50n50 50n50bu1 IXGH50N60B 50n60 transistor IXGK50N50BU1 IXGK50N60BU1 50N50B
Text: HiPerFASTTM IGBT with Diode V CES IXGK 50N50BU1 IXGK 50N60BU1 I C25 500 V 75 A 600 V 75 A V CE sat t fi 2.3 V 2.5 V 100ns 120ns Combi Pack Preliminary data Symbol Test Conditions Maximum Ratings 50N50 50N60 VCES VCGR TJ = 25°C to 150°C TJ = 25°C to 150°C; RGE = 1 MW
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50N50BU1
50N60BU1
100ns
120ns
50N50
50N60
O-264
IXGK50N50BU1
IXGK50N60BU1
50N60
G 50N60
50n50
50n50bu1
IXGH50N60B
50n60 transistor
IXGK50N50BU1
IXGK50N60BU1
50N50B
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50N60
Abstract: G 50N60 IXGH50N50B
Text: HiPerFAST IGBT IXGH 50N50B IXGH 50N60B VcES ^C25 VCE sai tfi 500 V 75 A 2.3 V 80 ns 600 V 75 A 2.5 V 150 ns Preliminary data <) Symbol Test Conditions Maximum Ratings 50N50 50N60 V CES Tj = 25°C to 150°C 500 600 V VcOR Tj = 25°C to 150°C; RGE = 1 M n
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50N50B
50N60B
50N50
50N60
O-247
G 50N60
IXGH50N50B
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Untitled
Abstract: No abstract text available
Text: Preliminary Data Sheet D V DSS HiPerFET Power MOSFET IXFN IXFN IXFK IXFK Single MOSFET Die 55N50 50N50 55N50 50N50 500V 500V 500V 500V K DS on ^D25 55A 50A 55A 50A 85m Q 100m£2 85m£2 100m£2 250ns 250ns 250ns 250ns TO-264 AA (IXFK) Symbol Maximum Ratings
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250ns
250ns
55N50
50N50
50N50
O-264
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50N60
Abstract: G 50N60 50n60b IXGH50N50B IXGH50N60B
Text: DIXYS HiPerFAST IGBT V CES IXGH 50N50B IXGH 50N60B 500 V 600 V ^C25 75 A 75 A V CE sat t,i 2.3 V 80 ns 2.5 V 150 ns Preliminary data Symbol Test Conditions Maximum Ratings 50N50 50N60 V CES Tj = 25°C to 150°C 500 600 V V CGR ^ = 25°C to 150°C; RGE = 1 Mi2
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50N50B
50N60B
50N50
50N60
O-247
50N50
G 50N60
50n60b
IXGH50N50B
IXGH50N60B
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50n60
Abstract: 50N50B IXGH50N50B IXGH50N60B
Text: a ix Y S HiPerFAST IGBT v IXGH/IXGT 50N50B IXGH/IXGT 50N60B CES ; t C 25 500 V : 75 A 600 V : 75 A V C E sa t i t ii 2.3 V 80 ns 2.5 V 150 ns Preliminary data Symbol < > Maximum Ratings Test C onditions TO-247 AD (IXGH) 50N50 ¡ 50N60 VCES T, = 25QC to150cC
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50N50B
50N60B
50N50
50N60
O-247
to150cC
O-268
50n60
IXGH50N50B
IXGH50N60B
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50n50
Abstract: No abstract text available
Text: aixYS Advanced Technical Information v HiPerFET Power MOSFETs ISOPLUS247™ IXFR 50N50 IXFR 55N50 Electrically Isolated Back Surface DSS p ^D25 500 V 43 A 500 V 48 A trr <250 ns DS(on) 100 mi] 80 m£2 Single MOSFET Die Symbol Test Conditions Maximum Ratings
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ISOPLUS247TM
50N50
55N50
Cto150
55N50
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50n50
Abstract: IXFK55N50 ISOPLUS247 55n50
Text: Advanced Technical Information □ IX Y S V DSS HiPerFET Power MOSFETs ISOPLUS247™ IXFR 50N50 IXFR 55N50 Electrically Isolated Back Surface D ^D25 500 V 43 A 500 V 48 A t rr < 250 ns DS(on) 100 mQ 80 mQ Single MOSFET Die Symbol TestConditions v Tj = 25°C to 150°C
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ISOPLUS247â
50N50
55N50
55N50
IXFK55N50
ISOPLUS247
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IXFN40N50
Abstract: No abstract text available
Text: DIXYS IXFN 55N50 IXFN 50N50 IXFK 55N50 IXFK 50N50 Single MOSFET Die rr Test Conditions Maximum Ratings IXFK IXFN IXFN 50 55 50 IXFK 55 Td = 25°C to 150°C T j = 25°C to 150°C 500 500 500 500 V V VGS v GSM Continuous Transient ±20 ¿30 ±20 ±30 V V »D25
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IXFN55N50
IXFN50N50
IXFK55N50
IXFK50N50
O-264
OT-227
IXFK55N50
IXFN55N50
BffW80N50
IXFN40N50
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50n60
Abstract: G 50N60 50N50B wj 508 50n50 IXGH50N50B IXGH50N60B
Text: □ IXYS Preliminary data V CES HiPerFAST IGBT Symbol IXGH 50N50B IXGH 50N60B 50N50 50N60 500 600 V V CGR Td = 25°C to 150°C; RGE = 1 M£i 500 600 V V GES Continuous ±20 V V GEM Transient ±30 V 'c 2 5 Tc = 25°C 75 A 'c 9 0 Tc = 90°C 50 A ' cm Tc = 25°C, 1 ms
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50N50B
50N60B
50N50
50N60
O-247
50n60
G 50N60
wj 508
50n50
IXGH50N50B
IXGH50N60B
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Untitled
Abstract: No abstract text available
Text: □ IXYS HiPerFAST IGBT with Diode V CES IXGK 50N50BU1 IXGK 50N60BU1 ^C25 500 V 75 A 600 V 75 A V CE sat tfi 2.3 V 2.5 V 100ns 120ns Combi Pack Preliminary data Symbol Maximum Ratings Test Conditions 50N50 V V CGR Td = 25°C to 150°C Td = 25°C to 150°C; RGE = 1 M£i
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50N50BU1
50N60BU1
100ns
120ns
50N50
50N60
IXGK50N50BU1
IXGK50N60BU1
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50n60
Abstract: 1xgh50n60b smd 601 servo drive 50n50 G 50N60 50n60b THT bsc 25 150N50 50N50B 321AL
Text: IXGH 50N60B IXGH 50N50B n ix Y S PRELIM INARY DATA 50N60B IXGH 50N60B IXGH 50N50B H iPer FAST IGBT VCES 600V 500V ^C25 ^CE(sat) tn 75 A 2.5V 150ns 75A 2.3V 80ns T O -247 £ Symbol Test Conditions Maximum Ratings 50N50 C (tab) 50N60 V CES Tj = 2 5 °C to 150°C
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50N60B
50N50B
50N60B)
150ns
50N50
50N60
O-247
50n60
1xgh50n60b
smd 601 servo drive
50n50
G 50N60
THT bsc 25
150N50
321AL
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