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    28C040

    Abstract: 28C256 atmel AT28C040 28c010 28C256 28HC64 MIL-M-38535 5F0280 AT28C010
    Text: PAGE 1 OF 4 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C040 EEPROM RELIABILITY DATA* - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - CYCLE TEST *. This data is applicable to the following device types due to same technology grouping as


    Original     		PDF AT-28C040 MIL-M-38535 AT-28C256 AT-28C010 AT-28C040 5F0280 5F9526 5F0723 5F9522 AT-28HC64 28C040 28C256 atmel AT28C040 28c010 28C256 28HC64 5F0280 AT28C010

    TSOP 173 g

    Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
    Text: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original     		PDF AT-27C040 MIL-M-38535 AT-27C1024 AT-27C512R AT-27C010 AT-27C040 12C/TSOP/SOIC/PDIP 6D9702 8B9832 TSOP 173 g 5H9602 6c9648 3b1326 5G9551 6F9627 4c19 3C1660 atmel 906