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    CY2910A Search Results

    CY2910A Datasheets (8)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    CY2910AC Cypress Semiconductor CMOS Microprogram Controller Scan PDF
    CY2910ADC Cypress Semiconductor CMOS Microprogram Controller Scan PDF
    CY2910ADMB Cypress Semiconductor CMOS Microprogram Controller Scan PDF
    CY2910AJC Cypress Semiconductor CMOS Microprogram Controller Scan PDF
    CY2910ALC Cypress Semiconductor CMOS Microprogram Controller Scan PDF
    CY2910ALMB Cypress Semiconductor CMOS Microprogram Controller Scan PDF
    CY2910AM Cypress Semiconductor CMOS Microprogram Controller Scan PDF
    CY2910APC Cypress Semiconductor CMOS Microprogram Controller Scan PDF

    CY2910A Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    cy7c9101

    Abstract: CY2901 CY7C190 PLD20RA10 CY2149 CY7C122 CY7C148 CY7C149 CY7C150 22V10-Macrocell
    Text: Military Product Selector Guide Static RAMs Size Organization 64 64 1K 1K 4K 4K 4K 4K 4K 8K 8K 16K 16K 16K 16K 16K 16K 16K 16K 16K 32K 32K 32K 32K 32K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 256K 256K 256K 256K 256K 256K 256K 1M 1M


    Original     		PDF MILSTD883D 22pin 24pin 28pin 32pin 300mil cy7c9101 CY2901 CY7C190 PLD20RA10 CY2149 CY7C122 CY7C148 CY7C149 CY7C150 22V10-Macrocell

    CY27S03A

    Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
    Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability


    Original     		PDF CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide

    CY7C9101

    Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
    Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the


    Original     		PDF

    Untitled

    Abstract: No abstract text available
    Text: £ 3 3 F '^ CYPRESS . SEMICONDUCTOR Features • F ast • • • • • • CY2910A = CMOS Microprogram Controller — CY2910AC has a 50-ns min. clock cycle; commercial — CY2910AM has a 51-ns (min.) clock cycle; military Low power — Ice (max.) = 170 mA


    OCR Scan     		PDF 12-bit Am2910A Am29C10A CY2910A 12-bit-wide

    Untitled

    Abstract: No abstract text available
    Text: CY2910A r'ypprcc CMOS Microprogram Controller SEMICONDUCTOR Features • — CY2910A C h a s a 5ft-ns m in . clock cycle; com m ercial — C Y 2910A M h a s a 51 -n s (m in .) clock cycle; m ilitary • Low power — I(X (m ax.) = 170 mA • In tern a l 9-w ord by 1 2-b it sta ck ca n be


    OCR Scan     		PDF CY2910A

    mpc30

    Abstract: am2910a CY2910AC CY2910AM AM29C10 JSBp jsbr 3
    Text: CY2910A ¿2 CYPRESS ^ 5 S '^ SEMICONDUCTOR Features • Fast — CY2910AC has a 50-ns min. clock cycle; commercial — CY2910AM has a 51-ns (min.) clock cycle; military • Low power — I c e (max.) = 170 mA • V c c margin o f 5V ± 10% commercial and military


    OCR Scan     		PDF CY2910A CY2910AC 50-ns CY2910AM 51-ns 12-bit 00010-B mpc30 am2910a AM29C10 JSBp jsbr 3

    CY7C2901

    Abstract: No abstract text available
    Text: ÌB Ìcy p ress • Table 10. Die Sizes of Cypress Devices continued P a rt N um ber Size (mil2) P a rt N um ber Size (mil2) ECL Logic CY 2909A 7968 CY100E301L 14875 CY2910A 21750 CY100E302L 14875 CY2911A 7968 CY100E422 6960 11800 CY100E474 10830 CY7C510


    OCR Scan     		PDF CY100E301L CY2910A CY100E302L CY2911A CY100E422 CY100E474 CY7C510 CY100E494 CY7C516 CY10E301L CY7C2901