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Catalog Datasheet	MFG & Type	Document Tags	PDF
HP83000 Abstract: HP8753E Kingston Technology testing of diode SAMSUNG RLC 4Mx1 Hyundai Semiconductor UPD488385FB-C80-45-BF1 UPD488385FB-C80-45BF1 KM418RD8C-RK80 Text: RDRAM Component Testing Summary As part of Intel’s enabling process, the following test/characterization procedure has been implemented on RDRAM components. A small sample of components 2-5 devices has been characterized on an HP83000 tester with Rebus, a test program written by Rambus. The RLC	Original	HP83000 HP8753E Kingston Technology testing of diode SAMSUNG RLC 4Mx1 Hyundai Semiconductor UPD488385FB-C80-45-BF1 UPD488385FB-C80-45BF1 KM418RD8C-RK80	PDF
HP83000 Abstract: 0.7 um CMOS process parameters Nitto 9850 JEDEC20 G226 Nitto MP8000 MP8000 ITS9000 atmel PLCC bottom "marking" MG2RTP Text: Qualpack MG2RT/MG2RTP Qualification Package MG2RT / MG2RTP 0.5 µm Radiation Tolerant SCMOS3 Technology MG2RT / MG2RTP 0.5 µm SCMOS3 1999 August TEMIC SEMICONDUCTORS IS AN ATMEL COMPANY Rev. 0 – 1999 August 1 Qualpack MG2RT/MG2RTP 1. General Information . 3	Original		PDF
HP83000 Abstract: HP83K HP83K tester TDS784 Tektronix TDS784 HP83000F330 F330 hp83 P6245 PC133-SDRAM Text: Intel PC 133 Validation Specification INTEL PC133 VALIDATION SPECIFICATION Rev. 1.03 Feb. 23, 2000 Intel Corporation Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document.	Original	PC133 HP83K, HP83K HP83000 HP83K tester TDS784 Tektronix TDS784 HP83000F330 F330 hp83 P6245 PC133-SDRAM	PDF
HP83000 Abstract: Electro SEX X81D1 HP8300 X41D ECL IC NAND Text: • 7 Ô1 1 D 7 3 O G lb a ^ O Tas B R K Iil Cyclone Series Cyclone Series GaAs Gate Arrays Rockwell Introduction The sub-micron Cyclone Series™ of GaAs gate arrays from Rockwell represent the culmination of over ten years of research and development.	OCR Scan		PDF
HP83000 Abstract: LI-300 Signal Path designer FLIP FLOP toggle Text: O V A t f k ln f lf A ll Lig h tn in g Series - LI300, LI1000 m m tM m jrtm . W % S m m Ultrahigh-Speed GaAs Gate Arrays Features Figure 1 Photomicrograph of the Lightning LI300 array • Advanced HBT GaAs process for high performance • Two array sizes: 300 or 1000 equivalent gates	OCR Scan	LI300, LI1000 CMO39-90 AA30450 7A11G73 HP83000 LI-300 Signal Path designer FLIP FLOP toggle	PDF