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    1009985

    Abstract: DC-12
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original
    HR05XXXW1S 01-20DB) DC-12 0-20DB MIL-STD-130. TP-8965. 755W002. 1009985 PDF

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original
    HR05XXXW1 01-20DB) DC-12 0-20DB TP-8965. MC0023. PDF

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original
    HR05XXXW1S 01-20DB) DC-12 0-20DB MIL-STD-1686. MIL-STD-130. TP-8965. PDF

    1009975

    Abstract: DC-12
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original
    HR05XXXW1 01-20DB) DC-12 0-20DB MIL-STD-130. TP-8965. 755W002. 1009975 PDF

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original
    HR05XXXW1S 01-20DB) DC-12 0-20DB TP-8965. MC0023. PDF