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    uPD42280V-30

    Abstract: uPD42280 UPD428 UD-P42
    Text: ยตPD42280 2-MBIT FIELD BUFFER 1996 Document No. S10655EJ1V0UM00 1st edition Date Published November 1996 N Printed in Japan NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and


    Original     		PDF PD42280 S10655EJ1V0UM00 uPD42280V-30 uPD42280 UPD428 UD-P42