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    SCAN18374T Search Results

    SCAN18374T Result Highlights (1)

    Part ECAD Model Manufacturer Description Download Buy
    SCAN18374T/MXA Rochester Electronics LLC SCAN18374T/MXA (DM: 5962-9320701MXA) Boundary Scan Bus Driver Visit Rochester Electronics LLC Buy
    SF Impression Pixel

    SCAN18374T Price and Stock

    Rochester Electronics LLC SCAN18374TSSC

    IC FF D-TYPE DUAL 9BIT 56SSOP
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    DigiKey SCAN18374TSSC Tube 58
    • 1 -
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    National Semiconductor Corporation SCAN18374TFMQB

    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Bristol Electronics SCAN18374TFMQB 3 1
    • 1 $70.083
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    Quest Components SCAN18374TFMQB 2
    • 1 $75.9233
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    • 100 $75.9233
    • 1000 $75.9233
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    National Semiconductor Corporation SCAN18374TSSC

    IC,FLIP-FLOP,18-BIT,D TYPE,BICMOS,SSOP,56PIN,PLASTIC
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    Quest Components SCAN18374TSSC 24
    • 1 $14.2
    • 10 $10.65
    • 100 $9.23
    • 1000 $9.23
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    Fairchild Semiconductor Corporation SCAN18374TSSC

    Boundary Scan Bus Driver, SCAN/JTAG/3J Series, 2-Func, 9-Bit, True Output, CMOS, PDSO56 '
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Rochester Electronics SCAN18374TSSC 1,291 1
    • 1 $5.01
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    • 100 $4.71
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    Rochester Electronics LLC SCAN18374T/MXA

    SCAN18374T/MXA (DM: 5962-9320701MXA) Boundary Scan Bus Driver
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Rochester Electronics SCAN18374T/MXA 86 1
    • 1 $377.03
    • 10 $377.03
    • 100 $354.41
    • 1000 $320.48
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    SCAN18374T Datasheets (9)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    SCAN18374T Fairchild Semiconductor D-Type Flip-Flop with 3-STATE Outputs Original PDF
    SCAN18374T National Semiconductor D Flip-Flop with TRI-STATE Outputs Original PDF
    SCAN18374T National Semiconductor SCAN-IEEE 1149.1 (JTAG COMPLIANT) Original PDF
    SCAN18374T National Semiconductor D Flip-Flop with TRI-STATE Outputs Original PDF
    SCAN18374TF National Semiconductor D Flip-Flop with TRI-STATE Outputs Original PDF
    SCAN18374TMDA National Semiconductor D Flip-Flop with TRI-STATE Outputs Original PDF
    SCAN18374TSSC Fairchild Semiconductor D Flip-Flop with 3-STATE Outputs Original PDF
    SCAN18374TSSCX Fairchild Semiconductor D Flip-Flop with 3-STATE Outputs Original PDF
    SCAN18374TSSCX_NL Fairchild Semiconductor D Flip-Flop with 3-STATE Outputs Original PDF

    SCAN18374T Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    SCAN18374TFMQB

    Abstract: logic ic databook 5962-9320701MXA C1996 SCAN18374T SCAN18374TSSC SCAN18374TSSCX
    Text: SCAN18374T D Flip-Flop with TRI-STATE Outputs General Description Features The SCAN18374T is a high speed low-power D-type flipflop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals This device is compliant with IEEE 1149 1 Standard Test Access Port and BOUNDARY-SCAN Architecture


    Original     		PDF SCAN18374T SCAN18374T SCAN18374TFMQB logic ic databook 5962-9320701MXA C1996 SCAN18374TSSC SCAN18374TSSCX

    Untitled

    Abstract: No abstract text available
    Text: OBSOLETE SCAN18374T www.ti.com SNLS037A – MAY 2004 – REVISED APRIL 2013 SCAN18374T D Flip-Flop with Tri-State Outputs Check for Samples: SCAN18374T FEATURES DESCRIPTION • • • The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized


    Original     		PDF SCAN18374T SNLS037A SCAN18374T

    SCAN18374T

    Abstract: SCAN18374TSSC BCP 39
    Text: Revised May 2000 SCAN18374T D-Type Flip-Flop with 3-STATE Outputs General Description Features The SCAN18374T is a high speed, low-power D-type flipflop featuring separate D-type inputs organized into dual 9bit bytes with byte-oriented clock and output enable control


    Original     		PDF SCAN18374T SCAN18374T SCAN18374TSSC BCP 39

    SCAN18374T

    Abstract: SCAN18374TFMQB
    Text: MICROCIRCUIT DATA SHEET Original Creation Date: 10/23/98 Last Update Date: 12/11/98 Last Major Revision Date: SCAN18374T-X REV 1A0 SERIALLY CONTROLLED ACCESS NETWORK D FLIP-FLOP WITH TRI-STATE OUTPUTS General Description The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type


    Original     		PDF MNSCAN18374T-X SCAN18374T M0000518 SCAN18374TFMQB

    SCAN18374T

    Abstract: No abstract text available
    Text: SCAN18374T D Flip-Flop with TRI-STATE Outputs General Description Features The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard


    Original     		PDF SCAN18374T SCAN18374T da959

    SCAN18374TFMQB

    Abstract: 5962-9320701MXA SCAN18374T SCAN18374TSSC SCAN18374TSSCX
    Text: SCAN18374T D Flip-Flop with 3-STATE Outputs General Description Features The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard


    Original     		PDF SCAN18374T SCAN18374T SCAN18374TFMQB 5962-9320701MXA SCAN18374TSSC SCAN18374TSSCX

    Untitled

    Abstract: No abstract text available
    Text: SCAN18374T SCAN18374T D Flip-Flop with TRI-STATE Outputs Literature Number: SNLS037 SCAN18374T D Flip-Flop with TRI-STATE Outputs General Description Features The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual


    Original     		PDF SCAN18374T SCAN18374T SNLS037

    master slave jk flip flop

    Abstract: ECL D flip flop Flip Flop DIP Flip flop JK cmos 74lvt16374 d flip flop d type flip flop flip flop flip flop circuit flip flop circuit type D
    Text: Logic Products by Function Flip-Flop Products Logic Product Family Product Description Package Voltage Node 74ACT109 FACT ACT Dual JK Positive Edge-Triggered Flip-Flop DIP SOIC TSSOP 5 DM74LS73A Bipolar-LS Dual Negative-Edge-Triggered Master-Slave J-K Flip-Flops with Clear and Complementary


    Original     		PDF 74ACT109 DM74LS73A MM74C73 74AC74 74ACT74 74ACTQ74 16-Bit 74VCXH162374 SCAN182374A master slave jk flip flop ECL D flip flop Flip Flop DIP Flip flop JK cmos 74lvt16374 d flip flop d type flip flop flip flop flip flop circuit flip flop circuit type D

    M38510 10102BCA

    Abstract: SCX6206 marking code E5 SMD ic jm38510/10101bga SCX6B48AIS SNJ54LS165J JM38510/30004bca JM38510/10102BCA JM38510/10102BIA 946DMQB
    Text: N ENHANCED SOLUTIONS DESIGN/PROCESS CHANGE NOTIFICATION formerly Military & Aerospace Division PCN Nr: 2000 Listing GIDEP Nr: GIDEP Category: Issued: 01/24/2000 TRB Nr: Product ID (Description): Proposed Date of Change: Description of Change: Effect of Change:


    Original     		PDF LM185BYH2 LM185BYH1 LM185E-1 LM185H-1 LM185WG-1 LM185H-2 M38510 10102BCA SCX6206 marking code E5 SMD ic jm38510/10101bga SCX6B48AIS SNJ54LS165J JM38510/30004bca JM38510/10102BCA JM38510/10102BIA 946DMQB

    Mil JAN jm38510 Cross Reference

    Abstract: JM38510 5962-8997001PC 5962-87572 5962-8991101XC DS16F95QMLV 75202 jm3851030402bca 5962-9203001MPC 7900801CA
    Text: NATIONAL SEMICONDUCTOR STANDARD MICROCIRCUIT DRAWING CROSS REFERENCE NATIONAL SEMICONDUCTOR STANDARD MICROCIRCUIT DRAWING CROSS REFERENCE 1/16/98 Part Numbering Guides Jan Product: JM38510 / 119 05 B P A MIL-M-38510 Basic Specification Lead Finish A = Solder, C = Gold


    Original     		PDF JM38510 MIL-M-38510 10krad 100krad O-100 SCAN18374TFMQB SCAN18540TFMQB SCAN18541TFMQB SCANPSC100FDMQB SCANPSC100FFMQB Mil JAN jm38510 Cross Reference 5962-8997001PC 5962-87572 5962-8991101XC DS16F95QMLV 75202 jm3851030402bca 5962-9203001MPC 7900801CA

    analog devices die list

    Abstract: 54AC245 74ACT04 LM108 LM137K SCAN18373T SCAN18374T SCANPSC100F SCANPSC110F
    Text: N VOLUME NO. 2 1999 BARE DIE USE IS GROWING RAPIDLY CONTENTS he rapid demand for smaller and PAGE 1 Bare Die Use is Growing BARE DIE MEET smaller consumer products is Rapidly pushing designers and manufacQUALITY, RELIABILITY, Page 2 Boundary Scan Assists turers to reassess their selection of comAND PERFORMANCE


    Original     		PDF

    SN54LVT18502

    Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502
    Text: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the


    Original     		PDF SN74BCT8374A ti8374; ispGDX160VA-3Q208; SN54LVT18502 SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502

    jm38510

    Abstract: JD5417BCA 54ACT3301W-QML 54ACT3301 JD5403BCA 5962-8752401PA JD54174BEA 5962-9958101QXC JD5407BCA JD54F157BEA
    Text: N STANDARD MICROCIRCUIT DRAWING CROSS REFERNCE and NOTES May 2000 N STANDARD MICROCIRCUIT DRAWING PART NUMBERING GUIDE JAN or MIL-M-38510 J M 3 8 5 1 / 1 1 9 05 B MIL-M-38510 Specification P A Lead finish A=solder,C-gold Radiation Assurance Indicator / M


    Original     		PDF MIL-M-38510 MIL-M-38510 di161SFA JM54AC163B2A JM54AC163BEA JM54AC163BFA JM54AC163S2A JM54AC163SEA JM54AC163SFA JM54AC191B2A jm38510 JD5417BCA 54ACT3301W-QML 54ACT3301 JD5403BCA 5962-8752401PA JD54174BEA 5962-9958101QXC JD5407BCA JD54F157BEA

    FQPF*7N65C APPLICATIONS

    Abstract: bc548 spice model bf494 spice model spice model bf199 LM3171 BC517 spice model bc547 spice model BF494 spice MOC3043-M spice model SPICE model BC237
    Text: Fairchild PSG.book Page i Wednesday, July 28, 2004 11:12 AM Fairchild Semiconductor Product Catalog Rev. 1 Analog & Mixed Signal Discrete Power Interface & Logic Microcontrollers Optoelectronics RF Power Front Matter.fm Page ii Monday, August 2, 2004 10:09 AM


    Original     		PDF UF4003. UF4004. UF4005. UF4006. UF4007. USB10H. USB1T1102 USB1T11A. vKA75420M W005G FQPF*7N65C APPLICATIONS bc548 spice model bf494 spice model spice model bf199 LM3171 BC517 spice model bc547 spice model BF494 spice MOC3043-M spice model SPICE model BC237

    PM3705

    Abstract: u326 laptop ic list corelis JTAG CONNECTOR JTAG PM3705 AN-1022 AN-1037 C1996 ic tester in circuit SCANPSC100F
    Text: National Semiconductor Application Note 1037 February 1996 This application example discusses the implementation of embedded system level boundary scan test within an actual design the National boundary scan demonstration system Its intent is to describe the decisions actions and results


    Original     		PDF AN-1022 PM3705 u326 laptop ic list corelis JTAG CONNECTOR JTAG PM3705 AN-1022 AN-1037 C1996 ic tester in circuit SCANPSC100F

    jm3851030402bca

    Abstract: JM38510 5962-9305501MCC 5962-8958602GA JD55115BEA JD54F08BCA JM54AC373BRA 5962-8762201ea 5962-8757203CA 7800802CA
    Text: NATIONAL SEMICONDUCTOR STANDARD MICROCIRCUIT DRAWING CROSS REFERENCE JULY, 1998 Part Numbering Guides Jan Product: JM38510 / 119 05 B P A MIL-M-38510 Basic Specification Lead Finish A = Solder, C = Gold "/" = Standard, D = 10krad RHA & R = 100krad RHA designation


    Original     		PDF JM38510 MIL-M-38510 10krad 100krad O-100 jm3851030402bca 5962-9305501MCC 5962-8958602GA JD55115BEA JD54F08BCA JM54AC373BRA 5962-8762201ea 5962-8757203CA 7800802CA

    LM6462

    Abstract: LM6464 LM103-3.6 54ACT3301 38510R75001 SMD MARKING CODE ACQ lm1242 MM54HC564 LH0041CJ 54AC00
    Text: N 4 N TABLE OF CONTENTS Included in this guide are the Enhanced Solutions products that are offered by National Semiconductor, their qualification levels, and packages as well as available process flows, radiation testing, and other information that can support your design.


    Original     		PDF 1-877-Dial-Die LM6462 LM6464 LM103-3.6 54ACT3301 38510R75001 SMD MARKING CODE ACQ lm1242 MM54HC564 LH0041CJ 54AC00

    pinout information of CMOS 4001, 4011, 4070

    Abstract: 54C922 CGS3301 54HC123A F100K ECL 300 series and design guide 4060 counter 4029 counter MM54HC245 MM54C76 4081 AND gate
    Text: N National Semiconductor offers a broad selection of advanced logic and interface families. Each family uniquely combines certain process and design techniques to address their evolving roles in system design. System & Board Test Products SCAN National’s portfolio of SCAN test products lowers a system’s cost of ownership over the course of its life cycle.


    Original     		PDF Spectrum/STV/5M96/Printed pinout information of CMOS 4001, 4011, 4070 54C922 CGS3301 54HC123A F100K ECL 300 series and design guide 4060 counter 4029 counter MM54HC245 MM54C76 4081 AND gate

    smd TRANSISTOR code marking w2t

    Abstract: MARKING SMD PNP TRANSISTOR w2t w2t smd transistor TRANSISTOR SMD MARKING CODE s2a SMD TRANSISTOR w2w smd marking e2w smd code W2W transistor e2w lm1455 marking code w2T
    Text: N Table of Contents QML Certification .1 National’s Space-Level Product Families .1


    Original     		PDF 1-800-52-HI-REL 1-800-52-HI-REL. smd TRANSISTOR code marking w2t MARKING SMD PNP TRANSISTOR w2t w2t smd transistor TRANSISTOR SMD MARKING CODE s2a SMD TRANSISTOR w2w smd marking e2w smd code W2W transistor e2w lm1455 marking code w2T

    teradyne victory

    Abstract: LMX2305WG-QML LMX2305WG-MLS CLC452 LMX2305 LMX2315 LMX2315WG-QML LMX2325 LMX2326 LMX2330
    Text: VOLUME NO. 15 1998 Phase Lock Loops Qualified for Military and Space Applications T oday’s communications and signal processing design requirements dictate more processing capacity in smaller volumes, operation for longer periods of time, and lower power consumption.


    Original     		PDF 550MHz teradyne victory LMX2305WG-QML LMX2305WG-MLS CLC452 LMX2305 LMX2315 LMX2315WG-QML LMX2325 LMX2326 LMX2330

    Untitled

    Abstract: No abstract text available
    Text: •M ICO N DUCTO R r SCAN18374T D Flip-Flop with 3-STATE Outputs Features ■ IEEE 1149.1 JTAG C om pliant ■ Buffered positive edge-triggered clock ■ 3-STATE outputs fo r bus-oriented applications ■ 9-bit data busses fo r parity applications ■ R educed-sw ing outputs source 32 m A/sink 64 mA


    OCR Scan     		PDF SCAN18374T SCAN18374T 18374T

    smd code A06

    Abstract: smd diode UJ 64 A 5962-9320701MXA SCAN18374T SCAN18374TFMQB SCAN18374TSSC SCAN18374TSSCX
    Text: EMICDNDUCTOR t SCAN18374T D Flip-Flop with 3-STATE Outputs General Description Features The S C A N 18374T is a high speed, low -pow er D-type flip-flop featuring separate D -type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control


    OCR Scan     		PDF SCAN18374T SCAN18374T smd code A06 smd diode UJ 64 A 5962-9320701MXA SCAN18374TFMQB SCAN18374TSSC SCAN18374TSSCX

    Untitled

    Abstract: No abstract text available
    Text: Semiconduc or SCAN18374T D Flip-Flop with TRI-STATE Outputs Features • IEEE 1149.1 JTAG C om pliant ■ Buffered positive edge-triggered clock ■ TRI-STATE outputs fo r bus-oriented applications ■ 9-bit data busses fo r parity applications ■ R educed-sw ing outputs source 24 m A/sink 48 m A (Mil)


    OCR Scan     		PDF SCAN18374T SCAN18374T 18374T

    Untitled

    Abstract: No abstract text available
    Text: S E M IC O N D U C T O R tm SCAN18374T D Flip-Flop with 3-STATE Outputs General Description Features The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control


    OCR Scan     		PDF SCAN18374T SCAN18374T