bct8240a
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
SNJ54BCT8240AFK
5962View
9174601Q3A
SNJ54BCT8240AJT
9174601QLA
bct8240a
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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F240
Abstract: SN54BCT8240A SN74BCT8240A SCBS067e
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
F240
SN54BCT8240A
SN74BCT8240A
SCBS067e
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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F240
Abstract: SN54BCT8240A SN74BCT8240A BCT8240A
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
F240
SN54BCT8240A
SN74BCT8240A
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TH25
Abstract: SN74BCT8240A F240 SN54BCT8240A
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
TH25
SN74BCT8240A
F240
SN54BCT8240A
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F240
Abstract: SN54BCT8240A SN74BCT8240A
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067D
BCT8240A
SN54BCT8240A
17ocal
F240
SN54BCT8240A
SN74BCT8240A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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BCT8240A
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
BCT8240A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
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F240
Abstract: SN54BCT8240A SN74BCT8240A
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
F240
SN54BCT8240A
SN74BCT8240A
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TH25
Abstract: F240 SN54BCT8240A SN74BCT8240A
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
TH25
F240
SN54BCT8240A
SN74BCT8240A
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SN54LVT18502
Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502
Text: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the
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SN74BCT8374A
ti8374;
ispGDX160VA-3Q208;
SN54LVT18502
SN54ABT8245
SN54ABT8543
SN54ABTH18502A
SN54BCT8240A
SN54BCT8244A
SN54BCT8245A
SN54BCT8373A
SN74ABT18245A
SN74ABT18502
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SC BS 067E -FE B R UA R Y 1 9 9 0 - REVISED DECEMBER 1996 SNS4BCT8240A . . . JT PACKAGE SN74BCT8240A . . . DW OR NT PACKAGE TOP VIEW M e m b e r s of the Texas I n s t r u m e nt s
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SN54BCT8240A,
SN74BCT8240A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E - FEBRUARY 1990 - REVISED DECEMBER 1996 • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits • Functionally Equivalent to ’F240 and
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
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F240
Abstract: SN54BCT8240A SN74BCT8240A BCT8240A DB471
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D - FEBRUARY 1990 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products SN54BCT8240A . . . JT PACKAGE SN74BCT8240A . . . DW OR NT PACKAGE TOP VIEW
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SN54BCT8240A,
SN74BCT8240A
SCBS067D
BCT240
F240
SN54BCT8240A
BCT8240A
DB471
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SN54BCT8240A
Abstract: SN74BCT8240A
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067C - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F240 and SN54/74BCT240 in the Normal
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SN54BCT8240A,
SN74BCT8240A
SCBS067C
SN54/74F240
SN54/74BCT240
SN54BCT8240A
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