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    CCD MTBF

    Abstract: IC SEM 2005 failure analysis IGBT ic SEM 2005 SMD BDJ0128B SEM 2005 SMD
    Text: 略語集 AC AES AFM AQL ATPG BEM Alternating Current Auger Electron Spectroscopy Atomic Force Microscope Acceptable Quality Level Automatic Test Pattern Generator Breakdown Energy of Metal BPSG CCD CDM CIM Boroｎ Phosphorous Silicon Glass Charge Coupled Device


    Original     		00400J1AF BDJ0128B CCD MTBF IC SEM 2005 failure analysis IGBT ic SEM 2005 SMD BDJ0128B SEM 2005 SMD PDF