IRFP250
Abstract: No abstract text available
Text: PD-20380B HFA45HI60C Ultrafast, Soft Recovery Diode FRED Features • • • • • • Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters Hermetic Electrically Isolated Ceramic Eyelets VR = 600V VF = 1.7V Qrr = 375nC
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PD-20380B
HFA45HI60C
375nC
O-259AA
IRFP250
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Untitled
Abstract: No abstract text available
Text: STDID5B N - CHANNEL 55V - 0.1 Ω - 12A TO-252 STripFET POWER MOSFET PRELIMINARY DATA TYPE STDID5B • ■ ■ VDSS R DS on ID 55 V < 0.12 Ω 12 A TYPICAL RDS(on) = 0.1 Ω APPLICATION ORIENTED CHARACTERIZATION ADD SUFFIX "T4" FOR ORDERING IN TAPE
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O-252
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Untitled
Abstract: No abstract text available
Text: Evaluates: MAX14970 MAX14970 Evaluation Kit General Description The MAX14970 evaluation kit EV kit provides a proven design to evaluate the MAX14970 dual-channel buffer. The EV kit contains four sections: an application circuit, characterization circuit, and two sets of calibration traces.
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MAX14970
MAX14970
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P40NF10
Abstract: JESD97 STP40NF10 p40nf
Text: STP40NF10 N-channel 100V - 0.025Ω - 50A TO-220 Low gate charge STripFET II Power MOSFET General features Type VDSS RDS on ID STP40NF10 100V <0.028Ω 50A • Exceptional dv/dt capability ■ Low gate charge at 100°C 3 ■ Application oriented characterization
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STP40NF10
O-220
P40NF10
JESD97
STP40NF10
p40nf
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dm 465
Abstract: HFA135NH40 IRFP250 NC4000
Text: PD -2.465 rev. B 03/99 HFA135NH40 HEXFRED Ultrafast, Soft Recovery Diode TM LUG TERMINAL ANODE Features Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters a d BASE CATHODE V R = 400V VF typ. = 1V IF(AV) = 135A
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HFA135NH40
290nC
dm 465
HFA135NH40
IRFP250
NC4000
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HFA140NJ60D
Abstract: IRFP250
Text: PD -2.514 rev. A 02/99 HFA140NJ60D HEXFRED Ultrafast, Soft Recovery Diode TM Anode 1 Features Cathode 2 Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters Base AC VR = 600V VF typ. = 1.2V IF(AV) = 140A Qrr (typ.) = 340nC
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HFA140NJ60D
340nC
HFA140NJ60D
IRFP250
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DS16F95QML
Abstract: ETS500 5962R0923561VZA LM4050WG2 LM4050WG2.5RLQV texas ldr LDR SPECIFICATION TM1019 Radiation Assured Devices LM4050Q
Text: 1 Single Event Transient and ELDRS Characterization Test Results for LM4050QML 2.5V Precision Reference Kirby Kruckmeyer, Member, IEEE, Elisa Morozumi, Member, IEEE, Robert Eddy, Thang Trinh, Tom Santiago and Pierre Maillard, Student Member, IEEE Abstract—National Semiconductor’s 100 krad Si low dose
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LM4050QML
LM4050WG2
com/opf/DS/DS16F95
DS16F95
RS-485
MIL-STD-883
June18,
/Downloads/MilSpec/Docs/MIL-STD883/std883
DS16F95QML
ETS500
5962R0923561VZA
LM4050WG2.5RLQV
texas ldr
LDR SPECIFICATION
TM1019
Radiation Assured Devices
LM4050Q
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PD245
Abstract: No abstract text available
Text: PD -2.453 rev. B 02/99 HFA240NJ40C HEXFRED Ultrafast, Soft Recovery Diode TM Features Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters LUG TERMINAL ANODE 1 LUG TERMINAL ANODE 2 BASE COMMON CATHODE V R = 400V VF typ. = 1V
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HFA240NJ40C
290nC
08-Mar-07
PD245
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STD20NF10
Abstract: No abstract text available
Text: STD20NF10 N-CHANNEL 100V - 0.038 Ω - 30A IPAK/DPAK LOW GATE CHARGE STripFET II POWER MOSFET • ■ ■ ■ ■ TYPE VDSS RDS on ID STD20NF10 100 V <0.045 Ω 30 A TYPICAL RDS(on) = 0.038 Ω EXCEPTIONAL dv/dt CAPABILITY APPLICATION ORIENTED CHARACTERIZATION
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STD20NF10
O-251)
O-252)
O-251
O-252
STD20NF10
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HFA160MD40C
Abstract: IRFP250
Text: PD-2.454 rev. B 12/98 HFA160MD40C HEXFRED Ultrafast, Soft Recovery Diode TM Features Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters LUG LUG LUG TERMINAL TERMINAL TERMINAL CATHODE ANODE 1 ANODE 2 Isolated Base
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HFA160MD40C
260nC
HFA160MD40C
IRFP250
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4200-PA
Abstract: 4200-SCS 4210-SMU 7078-TRX-BNC 4200-CAB-20UX 3m 4200 Keithley 236 4200 PA 4200-SMU 4200-MTRX-3
Text: Semiconductor Characterization System 4200-SCS The powerful test library management tools included allow standardizing test methods and extractions to ensure consistent test results. The 4200-SCS offers tremendous flexibility, with hardware options that include four different
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4200-SCS
4200-SCS
4200-PA.
4200-PA
4210-SMU
7078-TRX-BNC
4200-CAB-20UX
3m 4200
Keithley 236
4200 PA
4200-SMU
4200-MTRX-3
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HFA70NK60C
Abstract: IRFP250 017t
Text: PD -2.460A HFA70NK60C HEXFRED Ultrafast, Soft Recovery Diode TM BASE COMMON CATHODE Features Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters 1 ANODE 1 2 COMMON CATHODE 3 ANODE 2 VR = 600V VF typ. = 1.2V IF(AV) = 70A
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HFA70NK60C
210nC
HFA70NK60C
IRFP250
017t
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HFA240NJ40C
Abstract: IRFP250 2453
Text: PD -2.453 rev. B 02/99 HFA240NJ40C HEXFRED Ultrafast, Soft Recovery Diode TM Features Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters LUG TERMINAL ANODE 1 LUG TERMINAL ANODE 2 BASE COMMON CATHODE V R = 400V VF typ. = 1V
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HFA240NJ40C
290nC
HFA240NJ40C
IRFP250
2453
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HFA80NC40C
Abstract: No abstract text available
Text: PD -2.473 rev. B 01/99 HFA80NC40C TM Ultrafast, Soft Recovery Diode HEXFRED VR = 400V Features VF typ. = 1V • Reduced RFI and EMI • Reduced Snubbing • Extensive Characterization of Recovery Parameters IF(AV) = 80A Qrr (typ.) = 200nC IRRM(typ.) = 6A
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HFA80NC40C
200nC
HFA80NC40C
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HFA70NH60R
Abstract: IRFP250
Text: PD -2.456 rev. B 02/99 HFA70NH60R HEXFRED Ultrafast, Soft Recovery Diode TM LUG TERMINAL CATHODE Features Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters a d BASE ANODE V R = 600V V F typ. = 1.2V IF(AV) = 70A
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HFA70NH60R
340nC
HFA70NH60R
IRFP250
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STS2NF100
Abstract: No abstract text available
Text: STS2NF100 N-CHANNEL 100V - 0.23 Ω - 6A SO-8 STripFET II POWER MOSFET • ■ ■ ■ TYPE VDSS RDS on ID STS2NF100 100 V <0.26 Ω 6A TYPICAL RDS(on) = 0.23 Ω EXCEPTIONAL dv/dt CAPABILITY 100 % AVALANCHE TESTED APPLICATION ORIENTED CHARACTERIZATION
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STS2NF100
STS2NF100
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HFA140NH60
Abstract: IRFP250
Text: PD -2.447 rev. B 03/99 HFA140NH60 HEXFRED Ultrafast, Soft Recovery Diode TM LUG TERMINAL ANODE Features Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters a d BASE CATHODE V R = 600V V F typ. = 1.3V IF(AV) = 140A
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HFA140NH60
490nC
HFA140NH60
IRFP250
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HFB50HC20C
Abstract: No abstract text available
Text: PD - 94238A HFB50HC20C Ultrafast, Soft Recovery Diode FRED Features • • • • VR = 200V Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters Hermetic IF AV = 50A trr = 35ns Description These Ultrafast, soft recovery diodes are optimized to reduce losses and EMI/RFI in high frequency power
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4238A
HFB50HC20C
5M-1994.
O-258AA.
HFB50HC20C
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D-60
Abstract: HFA60MB60C IRFP250
Text: PD -2.462 rev. A 03/99 HFA60MB60C Ultrafast, Soft Recovery Diode HEXFRED TM Features ISOLATED BASE Reduced RFI and EMI Reduced Snubbing Extensive Characterization of Recovery Parameters (1-3) ANODE 1 (4-6) COMMON CATHODE (7-9) ANODE 2 VR = 600V
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HFA60MB60C
200nC
D-60
HFA60MB60C
IRFP250
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13010-01HYC
Abstract: 13010-01HYA 13010-01KYC SVRTR28
Text: SVRMC28 Series SPACE QUALIFIED HYBRID EMI FILTERS Models Available Input: 28 V nominal 4 A output Qualified to MIL-PRF-38534 Class H and Class K, TOR Compliant SVRMC Series EMI Filter 1.0 DESCRIPTION 1.2 SPACE LEVEL CHARACTERIZATIONS The SVRMC is specifically designed for use with the SVR series
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SVRMC28
MIL-PRF-38534
SVRMC28
13010-01HYC
13010-01HYA
13010-01KYC
SVRTR28
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SVRMH28
Abstract: TM2001 DC Line Filters
Text: SVRMH28 Series SPACE QUALIFIED HYBRID EMI FILTERS Models Available Input: 28 V nominal 2 A output Qualified to MIL-PRF-38534 Class H and Class K, TOR Compliant SVRMH Series EMI Filter 1.0 DESCRIPTION 1.2 SPACE LEVEL CHARACTERIZATIONS The SVRMH is specifically designed for use with the SVR series
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SVRMH28
MIL-PRF-38534
SVRMH28
TM2001
DC Line Filters
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Thermal resistance characterization of Power MOSFETs
Abstract: MOSFETs thermal resistance of low power semiconductor
Text: Thermal resistance characterization of Power MOSFETs Anup Bhalla Alpha & Omega Semiconductor January 2003. I. Introduction Power MOSFET junction temperature influences many operational parameters and device lifetime. To estimate device junction temperature in a circuit, or to compare
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ADC16DV160
Abstract: LMH6517EVAL AN1942 AN-1942
Text: LMH6517 Evaluation Board LMH6517 Evaluation Board National Semiconductor Application Note 1942 Loren Siebert December 1, 2009 30090011 FIGURE 1. LMH6517EVAL Evaluation Board General Description The LMH6517EVAL evaluation board is designed to aid in the characterization of National Semiconductor’s High Speed
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LMH6517
LMH6517EVAL
AN-1942
ADC16DV160
AN1942
AN-1942
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GCBZ670
Abstract: STB75NE75 25c016
Text: STB75NE75 N - CHANNEL 75V - 0.01 Q. - 75A - D^PAK STripFET POWER MOSFET TYPE STB75NE75 V dss R d S o i i Id 75 V < 0 . 0 1 3 Q. 75 A • . . . TYPICAL R D S (o n ) =0.01 EXCEPTIONAL dv/dt CAPABILITY 100% AVALANCHE TESTED APPLICATION ORIENTED CHARACTERIZATION
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STB75NE75
STB75NE75
O-263
GCBZ670
25c016
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