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CY27S03A Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability	Original	CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide	PDF
CY7C9101 Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901 Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the	Original		PDF
Untitled Abstract: No abstract text available Text: CY74S189, CY27LS03 CY27S03, CY27S07 CYPRESS SEMICONDUCTOR 16 x 4 Static R /W RAM Features • Three-state outputs • Fully decoded, 16 word x 4-bit high speed CMOS RAMs • TTL-compatible inteface levels • Inverting outputs 27S03, 27LS03, 74S189 c o n d itio n e d so th a t th e w rite d a ta is p re s	OCR Scan	CY74S189, CY27LS03 CY27S03, CY27S07 27S03, 27LS03, 74S189 38-00041-C	PDF
27S07PC Abstract: 74s189 Text: CY74S189, CY27LS03 CY27S03, CY27S07 r ^ y p p r c c ; SEMICONDUCTOR F eatures Fully d ecod ed , 16 w ord x 4-b it h igh speed C M O S RAM s Invertin g o u tp u ts 2 7 S 0 3 , 27L S 03, 7 4 S 189 N on -in vertin g ou tp u ts 2 7 S 0 7 H igh speed — 25 ns	OCR Scan	CY74S189, CY27LS03 CY27S03, CY27S07 27S07PC 74s189	PDF
27lS03 Abstract: CY27S07 74S189 cy7c189 CY27S07ALMB CY27S07PC 27S03 CY74S189 27S07 5189 Text: CY74S189, CY27LS03 CY27S03, CY27S07 W CYPRESS SEMICONDUCTOR Features 16 x 4 Static RAV RAM • Three-state outputs • in c o m p a t ib le interface levels • Fully decoded, 16 word x 4-bit high speed CMOS RAMs • Inverting outputs 27S03,27LS03, 74S189	OCR Scan	CY74S189, CY27LS03 CY27S03, CY27S07 27S03 27LS03, 74S189 27S07 27LS03) 64-bit 27lS03 CY27S07 74S189 cy7c189 CY27S07ALMB CY27S07PC CY74S189 27S07 5189	PDF
S1095 Abstract: CY27S07A Text: CY74S189, CY27LS03 CY27S03, CY27S07 CYPRESS SEMICONDUCTOR • Inverting outputs 27S03, 27LS03, 74S189 • Non-Inverting outputs 27S07 • High speed — 25 ns • Low power — 210 mW 27LS03 • Power supply 5V ± 10% • Advanced high-speed CMOS process	OCR Scan	27S03, 27LS03, 74S189 27S07 27LS03) CY74S189, CY27LS03 CY27S03, CY27S07 74S189PC S1095 CY27S07A	PDF
cy27s07almb Abstract: CY27S07PC 27ls03 74S189 7C189 cy74s189 Text: CY74S189, CY27LS03 CY27S03, CY27S07 CYPRESS SEMICONDUCTOR Features • Fully decoded, 16 word x 4-bit high speed CMOS RAMs • Inverting outputs 27S03, 27LS03, 74S189 • Non-inverting outputs 27S07 • High speed — 25 ns • Low power - 210 mW 27LS03	OCR Scan	27S03, 27LS03, 74S189 27S07 27LS03) CY74S189, CY27LS03 CY27S03, CY27S07 CY74S189PC cy27s07almb CY27S07PC 27ls03 74S189 7C189 cy74s189	PDF
27S03 Abstract: CY27S07ALMB cy74s189 CY27S07PC 27lS03 64-bit 16x4 ram with inverting three-state 54RM Text: CY74S189, CY27LS03 CY27S03, CY27S07 CYPRESS SEMICONDUCTOR ^ 16 x 4 Static RAV RAM Features • Three-state outputs • Fully decoded, 16 word x 4-bit high speed CM OS RAMs • TTL-compatible interface levels • Inverting outputs 27S03,27L S03, 74S189 These devices are high-performance	OCR Scan	CY74S189, CY27LS03 CY27S03, CY27S07 CY27S07) CY74S189PC CY74S189DC CY27LS03LMB CY27LS03DMB 38-00041-C 27S03 CY27S07ALMB cy74s189 CY27S07PC 27lS03 64-bit 16x4 ram with inverting three-state 54RM	PDF