MA31750 processor architecture
Abstract: 00E-12 mmu ericsson 29C516E ANM052 80C32 80C32E MA31750 65656E 80C32 Harris Semiconductor
Text: ANM052 MATRA MHS Radiation Tolerant SRAM for SPACE Applications Introduction The purpose of this document is to analyse the selection criteria for memory chips to be used in Spacecraft computers. A general trend is to implement more autonomous functions in Spacecraft, making use of increased
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ANM052
HRX/93
HM-65656E
00E-06
00E-07
00E-08
00E-09
00E-10
00E-11
00E-12
MA31750 processor architecture
00E-12
mmu ericsson
29C516E
ANM052
80C32
80C32E
MA31750
65656E
80C32 Harris Semiconductor
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temic 80C32
Abstract: mmu ericsson MA31750 processor architecture MA31750 80C32 Harris Semiconductor IDT39C60 65656F 29C516E microcontroller radiation hard 80C32E
Text: ANM052 Radiation Tolerant SRAM for SPACE Applications Introduction The purpose of this document is to analyze the selection criteria for memory chips to be used in Spacecraft computers. A general trend is to implement more autonomous functions in Spacecraft, making use of increased
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Original
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PDF
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ANM052
IDT49C460
IDT39C60
AN-24,
32kx8
HM-65664E
M-65656F
HRX/93
temic 80C32
mmu ericsson
MA31750 processor architecture
MA31750
80C32 Harris Semiconductor
65656F
29C516E
microcontroller radiation hard
80C32E
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u1d diode
Abstract: MD10 MD11 MD14 29C516E
Text: 29C516E 16–Bit Flow–Through EDAC Error Detection And Correction unit 1. Introduction The 29C516E TEMIC EDAC is a very low power flow–through 16–bit Error Detection And Correction unit EDAC with two user data buses. The EDAC is used in a high integrity system for monitoring and correction of
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29C516E
29C516E
EDAC16
MQFPF100
MQFPL100
u1d diode
MD10
MD11
MD14
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atmel edac
Abstract: 29C516E MD10 MD11 MD14
Text: 29C516E 16–Bit Flow–Through EDAC Error Detection And Correction unit 1. Introduction The 29C516E Atmel EDAC is a very low power flow–through 16–bit Error Detection And Correction unit EDAC with two user data buses. The EDAC is used in a high integrity system for monitoring and correction of
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PDF
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29C516E
29C516E
EDAC16
MQFPF100
MQFPL100
atmel edac
MD10
MD11
MD14
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29C516E
Abstract: MD10 MD11 MD14 N2227
Text: 29C516E 16–Bit Flow–Through EDAC Error Detection And Correction unit 1. Introduction The 29C516E TEMIC EDAC is a very low power flow–through 16–bit Error Detection And Correction unit EDAC with two user data buses. The EDAC is used in a high integrity system for monitoring and correction of
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Original
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PDF
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29C516E
29C516E
EDAC16
MQFPF100
MQFPL100
MD10
MD11
MD14
N2227
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MA31750 processor architecture
Abstract: atmel 80C32 atmel edac atmel 2816 memory mmu ericsson MA31750 6T SRAM a8961 microcontroller radiation hard SMKS-29C516E
Text: ANM052 Radiation Tolerant SRAM for SPACE Applications Introduction The purpose of this document is to analyze the selection criteria for memory chips to be used in Spacecraft computers. A general trend is to implement more autonomous functions in Spacecraft, making use of increased
|
Original
|
PDF
|
ANM052
IDT49C460
IDT39C60
AN-24,
32kx8
HM-65664E
M-65656F
HRX/93
MA31750 processor architecture
atmel 80C32
atmel edac
atmel 2816 memory
mmu ericsson
MA31750
6T SRAM
a8961
microcontroller radiation hard
SMKS-29C516E
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MD812
Abstract: 29C516E MD10 MD11 MD14 20 pin edac
Text: 29C516E MATRA MHS 16-Bit Flow-Through EDAC Error Detection And Correction unit Description The 29C516E MHS EDAC is a very low power flow-through 16-bit Error Detection And Correction unit EDAC with two user data buses. The EDAC is used in a high integrity system for monitoring and
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Original
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PDF
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29C516E
16-Bit
29C516E
MQFPF100
MQFPL100
MD812
MD10
MD11
MD14
20 pin edac
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