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    EIA-364-56 PROCEDURE 6 Search Results

    EIA-364-56 PROCEDURE 6 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    ECASD61C107M012KA0 Murata Manufacturing Co Ltd 7343 (7343M)/100μF±20%/16Vdc/12mOhm Visit Murata Manufacturing Co Ltd
    ECASD61A157M010KA0 Murata Manufacturing Co Ltd 7343 (7343M)/150μF±20%/10Vdc/10mOhm Visit Murata Manufacturing Co Ltd
    1206USB-262MBB Coilcraft Inc Data Line Filter, 2 Function(s), EIA STD PACKAGE SIZE 1206 Visit Coilcraft Inc Buy
    1206USB-872MBB Coilcraft Inc Data Line Filter, 2 Function(s), EIA STD PACKAGE SIZE 1206 Visit Coilcraft Inc Buy
    1206USB-102MBC Coilcraft Inc Data Line Filter, 2 Function(s), EIA STD PACKAGE SIZE 1206 Visit Coilcraft Inc Buy

    EIA-364-56 PROCEDURE 6 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    samtec connector lc

    Abstract: No abstract text available
    Text: TEST REPORT #98150 QUALIFICATION TESTING mm*., , n nr., ‘I‘bW / >aw SAMTEC CORPORATION .: :, <’ AUGUST 13,1998 TEST REPORT #98150 QUALIFICATION TESTING TSW/SSW SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC.


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    PDF 10012-l samtec connector lc

    6ES8

    Abstract: EIA-364-TP-27
    Text: CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec Corporation of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing


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    PDF 10012-l 6ES8 EIA-364-TP-27

    Untitled

    Abstract: No abstract text available
    Text: SEPTEMBER 29, 1995 TEST REPORT #95445 QUALIFICATION TESTING FTM/CLM SERIES SAMTEC CORPORATION APPROVED BY:' MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. I 1 Contech Research ’ , i .* ’ This is to certify that the evaluation described herein was


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    Untitled

    Abstract: No abstract text available
    Text: NOVEMBER 25,1998 TEST REPORT #98406 QUALIFICATION TESTING MECl SAMTEC CORPORATION / , &v/M’/* APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was


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    EIA-364 temperature rise

    Abstract: No abstract text available
    Text: NOVEMBER 25,1998 TEST REPORT #98406 QUALIFICATION TESTING MECl SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was


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    PDF 10012-l EIA-364 temperature rise

    Untitled

    Abstract: No abstract text available
    Text: JANUARY 9,1997 TEST REPORT #97609 QUALIFICATION TESTING TLE/TMMH SAMTEC CORPORATION APPROVED BY: MAX PEEL ' PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc.


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    Untitled

    Abstract: No abstract text available
    Text: JUNE 30,1998 TEST REPORT #98312 QUALIFICATION TESTING FTMH/MLE SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was


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    PDF 10012-l PROJECTtk98312 98312rf

    PGA370 pinout

    Abstract: pentium 3 pga370 MOTHERBOARD CIRCUIT diagram 370 socket pinout intel pentium 3 motherboard schematic diagram PGA370 PGA370 socket intel pentium 4 motherboard schematic diagram 8080 intel microprocessor pin diagram socket 370 pinout socket pga370
    Text: 370-Pin Socket PGA370 Design Guidelines Order Number: 244410-002 April, 1999 Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel's Terms and Conditions of Sale for such products, Intel


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    PDF 370-Pin PGA370) PGA370 pinout pentium 3 pga370 MOTHERBOARD CIRCUIT diagram 370 socket pinout intel pentium 3 motherboard schematic diagram PGA370 PGA370 socket intel pentium 4 motherboard schematic diagram 8080 intel microprocessor pin diagram socket 370 pinout socket pga370

    PGA370

    Abstract: PGA370 pinout pentium 3 pga370 MOTHERBOARD CIRCUIT diagram 370 socket pinout socket pga370 intel pentium 4 motherboard schematic diagram intel traceability code pentium 4 motherboard schematic diagram ATX MOTHERBOARD schematic intel pentium 3 motherboard schematic diagram
    Text: 370-Pin Socket PGA370 Design Guidelines Order Number: 244410-001 November, 1998 Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel’s Terms and Conditions of Sale for such products, Intel assumes no liability


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    PDF 370-Pin PGA370) USA/96/POD/PMG PGA370 PGA370 pinout pentium 3 pga370 MOTHERBOARD CIRCUIT diagram 370 socket pinout socket pga370 intel pentium 4 motherboard schematic diagram intel traceability code pentium 4 motherboard schematic diagram ATX MOTHERBOARD schematic intel pentium 3 motherboard schematic diagram

    ec 6sl

    Abstract: No abstract text available
    Text: NOVEMBER 20, 1996 TEST REPORT #96281 QUALIFICATION TESTING CLT/TMM SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research . CERTIFICATION This is to certify that the evaluation described herein was


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    PDF 10012-l ec 6sl

    Socket 754

    Abstract: AMD athlon socket 754 AMD socket s1 amd athlon 64 socket 754 AMD Socket 754 socket s1 Advanced Micro Devices EIA 364-60 EIA-364-103 socket S1 AMD Socket S1 PIN LAYOUT
    Text: Socket 754 Design and Qualification Requirements Publication # 24850 Rev: 3.07 Issue Date: August 2003 2001–2003 Advanced Micro Devices, Inc. All rights reserved. The contents of this document are provided in connection with Advanced Micro Devices, Inc. “AMD” products. AMD makes no representations or


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    PDF EIA-364-23 Alloy-194 Alloy-194­ EIA-364-70 EIA-364-20 Socket 754 AMD athlon socket 754 AMD socket s1 amd athlon 64 socket 754 AMD Socket 754 socket s1 Advanced Micro Devices EIA 364-60 EIA-364-103 socket S1 AMD Socket S1 PIN LAYOUT

    ZC-982

    Abstract: No abstract text available
    Text: / - DECEMBER 3, 1996 I I TEST REPORT #9628@ QUALIFICATION TESTING CLE/FTE SAMTEC CORPORATION I APPROVED BY: LUANNE WITT PROGRAM MANAGER CONTECH RESEARCH, INC. CJl!y!yR 1 Contech Research - CERTIFICATION This is to certify that the evaluation described herein was


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    PDF 10012-l ZC-982

    intel 94v-0 MOTHERBOARD MANUAL

    Abstract: ls 36 motherboard manual intel traceability idc connector 10 pin intel date code marking sn SMA EIA-364 ink cartridge chip Accelerometer 300g "pin to pin capacitance" A157
    Text: 330-Contact Slot Connector SC330 Design Guidelines Release Date: September 1998 Order Number: 244428-001 330-Contact Slot Connector (SC330) Design Guidelines Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual


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    PDF 330-Contact SC330) USA/96/POD/PMG intel 94v-0 MOTHERBOARD MANUAL ls 36 motherboard manual intel traceability idc connector 10 pin intel date code marking sn SMA EIA-364 ink cartridge chip Accelerometer 300g "pin to pin capacitance" A157

    99093

    Abstract: 3478A DFIS-100
    Text: MAY 28,1999 TEST REPORT 1198643 QUALIFICATION TESTING PSS-23-01-T-S HFWS-20-01-T-S SAMTEC CORPOR4TION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was


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    PDF PSS-23-01-T-S HFWS-20-01-T-S 10012-l 99093 3478A DFIS-100

    T40 16 ultrasonic

    Abstract: No abstract text available
    Text: L<. ru c: ” Ial c E: rl r 1 c $1 !‘7 I * plrasRvARY 18, X999 lu TEST REPORT #98689 . . . tar QUALIFICATLOM TESTING . X&T-075-05-L-D-A HItF-075-02-L-D-A SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVABTCED RESEARCH CONTECH RESEARCH, INC.


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    PDF T-075-05-L-D-A HItF-075-02-L-D-A T40 16 ultrasonic

    intel date code marking

    Abstract: Accelerometer 300g AP-826 Connector 221 intel MOTHERBOARD pcb design in SC242 411C A121 Single Edge Contact (S.E.C.) Cartridge:
    Text: SC242 Connector Design Guidelines August, 1998 Order Number: 243397-002 Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel's Terms and Conditions of Sale for such products, Intel assumes no liability


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    PDF SC242 intel date code marking Accelerometer 300g AP-826 Connector 221 intel MOTHERBOARD pcb design in 411C A121 Single Edge Contact (S.E.C.) Cartridge:

    CL4 valve

    Abstract: t122 25 3
    Text: APRIL 7,1998 TEST REPORT #97626 QUALIFICATION TESTING CSB/MSB SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was


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    PDF 10012-l 97626ff CL4 valve t122 25 3

    intel d3001

    Abstract: 243397 411C A121 B121 D3001 intel traceability code Single Edge Contact (S.E.C.) Cartridge:
    Text: E Slot 1 Connector Design Guidelines August 1997 Order Number: 243397-001 9/15/97 11:58 AM 24339701.DOC INTEL CONFIDENTIAL until publication date E Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or


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    Untitled

    Abstract: No abstract text available
    Text: MAY 30,1997 TEST REPORT #97144 QUALIFICATION TESTING SOLC/TOLC SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. L ~-Jqiijzii$ Contech Research CERTIFICATION This is to certify that the evaluation described herein was


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    PDF 10012-l 97144RF

    EIA364

    Abstract: EIA-364
    Text: JUNE 30,1997 TEST REPORT #97236 QUALIFICATION TESTING FLE/FTSH SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was


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    PDF 10012-l EIA364 EIA-364

    99218

    Abstract: POM7-256C Fluke 54200 HLE-115
    Text: JULY 14, 1999 TEST REPORT #99218 QUALIFICATION TESTING HLE-115-Ol-L-DV TSM-115-04-L-DV SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. L REVISION LEVEL DATE DESCRIPTION REVISION NO. - r INITIAL ISSUE


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    PDF HLE-115-Ol-L-DV TSM-115-04-L-DV 992180C 99218 POM7-256C Fluke 54200 HLE-115

    Untitled

    Abstract: No abstract text available
    Text: CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec Corporation of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing


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    PDF 10012-l H331N0search

    Untitled

    Abstract: No abstract text available
    Text: APRIL 21,1998 TEST REPORT #98093 QUALIFICATION TESTING SE1 CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec Corporation of New Albany, IN who was the test sponsor.


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    Untitled

    Abstract: No abstract text available
    Text: BCcomponents COMPONENTS BCcomponents Product specification DCS 0 4 0 2 ; DCT 0 6 0 3 ; DCU 0 8 0 5 ; DCA 1206 T h ick film fla it site. A thick film is screen printed on a high grade alumina ceramic substrate to form the resistive layer. Pre-contacts are printed on both sides of the substrate. The resistors are laser


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