27C2048
Abstract: 7A9819 MIL-M-38535 plcc failures
Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C2048 CMOS EPROM RELIABILITY DATA - 150°C RETENTION BAKE (PLASTIC) - EXTENDED THERMAL SHOCK - EXTENDED TEMPERATURE CYCLE - 85°C/85% RETENTION HUMIDITY OPERATING LIFE TEST - 15 PSIG PRESSURE POT
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AT-27C2048
MIL-M-38535
AT-27C2048
6B1924
6B9633
7A0378-2
27C2048
7A9819
plcc failures
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MIL-M-38535
Abstract: No abstract text available
Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV4096 CMOS EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - EXTENDED TEMPERATURE CYCLE - 85°C/85% RETENTION HUMIDITY OPERATING LIFE TEST
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AT-27BV4096
MIL-M-38535
AT-27BV4096
7B0853
7B9745
7C9817
8B9922
0G2297
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27C4096
Abstract: 7G9737 27C4096 eprom 4E0421 MIL-M-38535
Text: PAGE 1 OF 11 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C4096 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLE
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AT-27C4096
MIL-M-38535
AT-27C040
AT-27C010
AT-27C4096
3G0346
3J0350
4E0421
5F0514
27C4096
7G9737
27C4096 eprom
4E0421
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27C4096
Abstract: 6B9635 3J0350 MIL-M-38535 40-VSOP
Text: PAGE 1 OF 11 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C4096 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLE
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AT-27C4096
MIL-M-38535
AT-27C040
AT-27C010
AT-27C4096
7G9737
8E9913
3G0346
3J0350
27C4096
6B9635
3J0350
40-VSOP
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5A9516
Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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AT-27C010
AT-27C010
E901-14056
2D1147-12
5A9516
5H9606
5H9605
7H9744
2A9212
5A9524
7H9747
9d9018
5c112
1B9126
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TSOP 173 g
Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Text: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
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AT-27C040
MIL-M-38535
AT-27C1024
AT-27C512R
AT-27C010
AT-27C040
12C/TSOP/SOIC/PDIP
6D9702
8B9832
TSOP 173 g
5H9602
6c9648
3b1326
5G9551
6F9627
4c19
3C1660
atmel 906
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2a92
Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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AT-27C010
AT-27C010
E901-14056
2D1147-12
2a92
27C010A
6E9621
6B9637
3A9315
3E0317
5A9516
5C9550
1B9126
2D1150-9
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27C1024
Abstract: MIL-M-38535 2C9237 4B942 3B93
Text: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
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AT-27C1024
MIL-M-38535
AT-27C010
AT-27C1024
27C1024
2C9237
4B942
3B93
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27c080
Abstract: tsop 138 atmel 27c080 resistor activation energy MIL-M-38535 tsop40 3D0442-1
Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C080 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT * This report was generated from AT-27C080 reliability testing.
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AT-27C080
MIL-M-38535
AT-27C040
AT-27C4096
AT-27C080
A3B0575-2
3B9336
A3B0575-1
3B9331
27c080
tsop 138
atmel 27c080
resistor activation energy
tsop40
3D0442-1
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M1014
Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
Text: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS
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AT-27C256R
from27C256R
4B0691
8703A)
M1014
K2078
1c9136
5D9602
AT27C010
AT27C512R
1C9133
27c256r
1A9110
3D9352
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27c516
Abstract: 6C9650 6c9640 6C9639 5D9611 27C1024 MIL-M-38535 6b2933
Text: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C516 CMOS EPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
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AT-27C516
MIL-M-38535
AT-27C1024
AT-27C516
4D20CC
6B9634
7H9841
6C9639
27c516
6C9650
6c9640
6C9639
5D9611
27C1024
6b2933
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27BV040
Abstract: MIL-M-38535 6a9618
Text: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV040 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING
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AT-27BV040
MIL-M-38535
AT-27BV010
AT-27BV020
AT-27BV040
4C2309
4C9504
5A1214
5A9521
27BV040
6a9618
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27c512r
Abstract: ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484
Text: PAGE 1 OF 17 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C512R CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST -150°C HIGH TEMPERATURE REVERSE BIAS (HTRB) -200°C RETENTION BAKE -PROGRAM/ERASE CYCLE -125°C OPERATING LIFE TEST (PLASTIC)
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AT-27C512R
MIL-M-38510
AT-27C256R
AT-27C010
AT-27C512/512R
2J0301
4J0451
6J0707
7F0721
27c512r
ATMEL AT27c512
8a039
6J24
233759A-13
4b23
3C1091
2d9306
9c9949
5c2484
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2E0210
Abstract: 8A9835 2h0245
Text: PAGE 1 OF 5 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV512 CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT -EXTENDED TEMPERATURE CYCLE JULY 2003 2325 Orchard Parkway San Jose CA. 95131
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AT-27BV512
AT-27BV512
7D3370-2
7D9812
8D0946-3
8D9901
2H1980A
2H0245
2E0210
8A9835
2h0245
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MIL-M-38535
Abstract: No abstract text available
Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV256 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING - EXTENDED THERMAL SHOCK * This report was generated from AT-27BV256 reliability testing.
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AT-27BV256
MIL-M-38535
AT-27BV010
AT-27BV020
AT-27BV256
5B1402
5B9552
7D3024B
7D9813
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TSOP 54 Package
Abstract: 27bv010 report on PLCC 6A17 MIL-M-38535 5A9530 7C9745 8b99
Text: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV010 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING - EXTENDED THERMAL SHOCK - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
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AT-27BV010
MIL-M-38535
AT-27BV040
AT-27BV020
AT-27BV010
5A9516
5A9525
5A9530
TSOP 54 Package
27bv010
report on PLCC
6A17
5A9530
7C9745
8b99
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report on PLCC
Abstract: 7B9742 3G0329 TSOP Package MIL-M-38535 0B0027 2G0232
Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27BV020 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - EXTENDED THERMAL SHOCK - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING * This report was generated from AT-27BV020 reliability testing.
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AT-27BV020
MIL-M-38535
AT-27BV040
AT-27BV020
4C2629
4C9501
6A0980-1
9B9930
1C0144
report on PLCC
7B9742
3G0329
TSOP Package
0B0027
2G0232
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ST62T20
Abstract: EPROM retention bake st6220 programmer ST6220 ST62t20* programming
Text: APPLICATION NOTE SELECTING BETWEEN ROM AND OTP FOR A MICROCONTROLLER by Microcontroller Division Applications INTRODUCTION A customer who develops an MCU based application needs different levels of flexibility in the ability to perform code modifications these levels are explained on the next page . To satisfy
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st6220 programmer
Abstract: AN1068 AN886 ST6220 ST62T20 EPROM retention bake
Text: AN886 APPLICATION NOTE SELECTING BETWEEN ROM, FASTROM AND OTP FOR A MICROCONTROLLER by Microcontroller Division Applications INTRODUCTION A customer who develops an MCU-based application needs various levels of flexibility in order to perform code modifications at different times in the life cycle of the product these levels are
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AN886
AN1068
st6220 programmer
AN886
ST6220
ST62T20
EPROM retention bake
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EPROM retention bake
Abstract: st6220 programmer ST6220 ST62T20 eprom st62t20
Text: APPLICATION NOTE SELECTING BETWEEN ROM AND OTP FOR A MICROCONTROLLER by the Micro Divisions INTRODUCTION A customer who develops an MCU based application needs different levels of flexibility in the ability to perform code modifications these levels are explained on the next
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QRR0001
Abstract: ST16 m29f002 065um ST M27C256B PART MARKING FM27c1024 QRR000
Text: QRR0001 QUALITY & RELIABILITY REPORT April 1999 March 2000 EPROM, Flash Memory, EEPROM, NVRAM and SMARTCARD Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which include: Non-volatile memories: Flash memory, UV EPROM, OTP EPROM and
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QRR0001
QRR0001
ST16
m29f002
065um
ST M27C256B PART MARKING
FM27c1024
QRR000
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ST M27C256B PART MARKING
Abstract: M29W080 QRR0003 stmicroelectronics datecode m27C256 Marking STMicroelectronics m27c256 m29w160 reliability report M29W160 QRR000 QRR0001 ST16
Text: QRR0003 QUALITY & RELIABILITY REPORT October 1999 September 2000 EPROM, Flash Memory, EEPROM, NVRAM and SMARTCARD Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which include: Non-volatile memories: Flash memory, UV EPROM, OTP EPROM and
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QRR0003
ST M27C256B PART MARKING
M29W080
QRR0003
stmicroelectronics datecode m27C256
Marking STMicroelectronics m27c256
m29w160 reliability report
M29W160
QRR000
QRR0001
ST16
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flash "high temperature data retention" mechanism
Abstract: EPROM retention bake ST62t20* programming st6220 programmer AN1068 ST6220 ST62T20
Text: APPLICATION NOTE SELECTING BETWEEN ROM, FASTROM AND OTP FOR A MICROCONTROLLER by Microcontroller Division Applications INTRODUCTION A customer who develops an MCU-based application needs various levels of flexibility in order to perform code modifications at different times in the life cycle of the product these levels are
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AN1068.
flash "high temperature data retention" mechanism
EPROM retention bake
ST62t20* programming
st6220 programmer
AN1068
ST6220
ST62T20
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M25C
Abstract: Marking STMicroelectronics m27c256 QRR0001 QRR0002 ST16 M29W160 M275 M27C512 marking QRR000 ST M27C256B PART MARKING
Text: QRR0002 QUALITY & RELIABILITY REPORT July 1999 June 2000 EPROM, Flash Memory, EEPROM, NVRAM and SMARTCARD Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which include: Non-volatile memories: Flash memory, UV EPROM, OTP EPROM and
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QRR0002
M25C
Marking STMicroelectronics m27c256
QRR0001
QRR0002
ST16
M29W160
M275
M27C512 marking
QRR000
ST M27C256B PART MARKING
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