1009885
Abstract: DC-12 TP 1322
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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HR03XXXS
01-20DB)
DC-12
MIL-STD-1686.
MIL-STD-130.
TP-8965
TP-8965.
755W002.
1009885
TP 1322
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PDF
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1009915
Abstract: TP 1322
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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HR03XXXW1
01-20DB)
MIL-STD-1686.
MIL-STD-130.
TP-8965
TP-8965.
755W002.
09-E1001
1009915
TP 1322
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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HR03XXXS
01-20DB)
DC-12
TP-8965.
MC0023.
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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HR03XXXW1S
01-20DB)
MIL-STD-1686.
MIL-STD-130.
TP-8965
TP-8965.
MC0023.
04-E272
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXX X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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HR03XXX
01-20DB)
DC-12
TP-8965.
MC0023.
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PDF
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1009895
Abstract: HR03XXXW3 TP-8965
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW3 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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HR03XXXW3
01-20DB)
MIL-STD-130.
TP-8965
TP-8965.
755W002.
09-E1001
1009895
HR03XXXW3
TP-8965
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PDF
|
1009875
Abstract: TP 1322 DC-12
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXX X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR03XXX
01-20DB)
DC-12
MIL-STD-1686.
MIL-STD-130.
TP-8965
TP-8965.
755W002.
1009875
TP 1322
|
PDF
|
waffle
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXG X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (00-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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HR03XXXG
00-20DB)
DC-12
MIL-STD-1686.
MIL-STD-130.
TP-8965
TP-8965.
755W002.
waffle
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
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HR03XXXW1
01-20DB)
TP-8965.
MC0023.
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR03XXXW3S
01-20DB)
MIL-STD-1686.
MIL-STD-130.
TP-8965
TP-8965.
MC0023.
04-E272
|
PDF
|
1009905
Abstract: TP 1322 HR03XXXW3 0120d
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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HR03XXXW3S
01-20DB)
MIL-STD-130.
TP-8965
TP-8965.
755W002.
09-E1001
1009905
TP 1322
HR03XXXW3
0120d
|
PDF
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1009925
Abstract: TP 1322
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR03XXXW1S
01-20DB)
MIL-STD-1686.
MIL-STD-130.
TP-8965
TP-8965.
755W002.
09-E1001
1009925
TP 1322
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR03XXXW1S
01-20DB)
TP-8965.
MC0023.
|
PDF
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR03XXXS
01-20DB)
DC-12
MIL-STD-1686.
MIL-STD-130.
TP-8965
TP-8965.
MC0023.
|
PDF
|
|
|
Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR03XXXW3 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
|
Original
|
HR03XXXW3
01-20DB)
TP-8965.
MC0023.
|
PDF
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