MIL-STD-883-METHOD 2016 Search Results

MIL-STD-883-METHOD 2016 Result Highlights (5)

Part	Manufacturer	Description
DFE2016CKA-1R0M=P2	Murata Manufacturing Co Ltd	Fixed IND 1uH 1800mA NONAUTO
DFE2016CKA-2R2M=P2	Murata Manufacturing Co Ltd	Fixed IND 2.2uH 1400mA NONAUTO
DE6B3KJ151KA4BE01J	Murata Manufacturing Co Ltd	Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive
DE6B3KJ471KB4BE01J	Murata Manufacturing Co Ltd	Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive
DE6E3KJ152MN4A	Murata Manufacturing Co Ltd	Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive

MIL-STD-883-METHOD 2016 Datasheets Context Search

Catalog Datasheet	MFG & Type	PDF	Document Tags
INCOMING RAW MATERIAL INSPECTIONs Abstract: INCOMING RAW MATERIAL INSPECTION in-process quality inspections mil-std-883 INCOMING RAW MATERIAL INSPECTION method MIL-STD-883 method 2003 in-coming quality control INCOMING RAW MATERIAL process flow Text: QUALITY AND RELIABILITY QUALITY SYSTEM Product quality at Dallas Semiconductor results from a combination of design techniques, vendor controls, manufacturing methods, process monitors, and quality control inspections. SPC monitors placed at strategic points ensure that potential defects are detected	Original	PDF
INCOMING RAW MATERIAL INSPECTION method Abstract: INCOMING RAW MATERIAL INSPECTION INCOMING RAW MATERIAL INSPECTIONs in-process quality inspections in-coming quality control quality acceptance plan MIL-STD-883 method 2003 Text: QUALITY AND RELIABILITY QUALITY SYSTEM Product quality at Dallas Semiconductor results from a combination of design techniques, vendor controls, manufacturing methods, process monitors, and quality control inspections. SPC monitors placed at strategic points ensure that potential defects are detected	Original	PDF
JESD22-A108-A Abstract: JESD22-A104-A JESD22*108 EIA-671 JEDS22-C101-A doc-70 ISO14000 J-STD-035 8110014 Distributors and Sales Partners Text: Reliability and Quality Assurance February 2002 Introduction Lattice Semiconductor Corporation LSC designs, develops and markets high performance programmable logic devices (PLDs) and related development system software. Lattice Semiconductor is the inventor and world's leading supplier of in-system programmable (ISPtm) CPLDs. PLDs are standard semiconductor components that can	Original	PDF	MIL-STD-883, MIL-STD-883E, J-STD-035 JESD22-A108-A JESD22-A104-A JESD22*108 EIA-671 JEDS22-C101-A doc-70 ISO14000 J-STD-035 8110014 Distributors and Sales Partners
68LC060 Abstract: F98S Motorola Mil Std. 883 xpc860 A113 J24A XPC850 Text: Reliability Report for Networking Communication Microprocessors XPC850 Rev 0.3 XPC860 XPC860T 0.42m Single Poly Wafer Fabrication Process Revision: 5/99 1.0 Purpose and Description This report summarizes the reliability data for Motorola communication microprocessors fabricated on the 0.42m single polysilicon process in our wafer	Original	PDF	XPC850 XPC860 XPC860T 68LC060 F98S Motorola Mil Std. 883 xpc860 A113 J24A XPC850
F98S Abstract: xpc860 68LC060 A113 J24A XPC850 Motorola, HBM, 1kv Text: Freescale Semiconductor, Inc. Reliability Report for Freescale Semiconductor, Inc. Networking Communication Microprocessors XPC850 Rev 0.3 XPC860 XPC860T 0.42m Single Poly Wafer Fabrication Process Revision: 5/99 For More Information On This Product, Go to: www.freescale.com	Original	PDF	XPC850 XPC860 XPC860T F98S xpc860 68LC060 A113 J24A XPC850 Motorola, HBM, 1kv
MH1RT Abstract: 65609E AT56K sn17 Text: MH1RT QualPack Qualification Package MH1RT Sea of Gates Radiation Tolerant 0.35 µm CMOS MH1RT Sea of Gates 0.35 µm CMOS for Space Environment QualPack Rev.2 – Jan. 2002 1 MH1RT QualPack 1. Table of Contents 1. Table of Contents . 2	Original	PDF
51V019S-33WN Abstract: APP001 APP003 C5533 MIL-STD-202F-208F ISR071008 app-003 Text: Initial Sample Release FREEPORT TITLE NO:RDD042 ISR071008 Part Name HDMI Receptacle with wing vertical SMT type Document No FREEPORT Part No./Rev 51V019S-33WN-B-FEC Customer Part No. Reason for Initial Sample: Initial Submission Change Subcontractor Source	Original	PDF	RDD042 ISR071008 51V019S-33WN-B-FEC CE/2006/C5533 CE/2006/C5533* 51V019S-33WN APP001 APP003 C5533 MIL-STD-202F-208F ISR071008 app-003
atmel MSL 1 Abstract: AT24C1024 k 355k M3015 atmel Reflow soldering 8 lead SOIC AT17LV002 AT17LV002A AT17LV010A AT17LV040 AT17LV128A Text: 35.5K Configurator Qualification Package Date: June 20, 2002 From: 35.5K Configurator Product Engineering Subj.: Qualification By 35.5K Devices Dear Valued Customer, The following Configurator devices are all fabricated using Atmel’s 35.5K processes. For Qualification	Original	PDF	AT17LV010 AT17LV010A AT17LV040 AT17LV002 AT17LV002A AT17LV512 AT17LV512A AT17LV256 AT17LV256A AT17LV128 atmel MSL 1 AT24C1024 k 355k M3015 atmel Reflow soldering 8 lead SOIC AT17LV040 AT17LV128A
4n54txvb Abstract: No abstract text available Text: Select Products Here Go 4N51 4N52 4N54 Hermetic Hexadecimal Display With Logic DESCRIPTION The 4N51 ia a hermetically sealed solid-state numeric display that decodes positive 8421 BCD logic inputs into characters 0-9, a "-" sign, a test pattern, and four blanks in the invalid BCD states. The display has a right-hand decimal	Original	PDF	MIL-STD-883 com/catalog/4n51 4/4n51 4n54txvb
40F-701-1-15 Abstract: nikon STEPPER 71007 MIL-STD-883 method 5003 INCOMING MATERIAL INSPECTION procedure harris top marking product change notification Text: Status of Document is:RELEASED Effective from: 19-SEP-1997 14:23:42 to Date Printed: 09/24/97 7:46 AM SECTION 2.0 Controlled Document QML GENERAL NON-TECHNOLOGY SPECIFIC GENERAL Section 2.0 of this manual is written to describe the general (non-technology specific)	Original	PDF	19-SEP-1997 210XXX 710-010-XX 40F-400-0-0 40F-701-1-15 nikon STEPPER 71007 MIL-STD-883 method 5003 INCOMING MATERIAL INSPECTION procedure harris top marking product change notification
TM2004 Abstract: MIL-STD-883 method 5003 TM1011 ACT-R01 54XXXX 40F-701-1-15 marking 25b harris top marking product change notification Harris top marking Text: Status of Document is:RELEASED Effective from: 02-JUN-1997 08:18:36 to Date Printed: 06/09/97 6:39 AM SECTION 2.0 Controlled Document QML GENERAL NON-TECHNOLOGY SPECIFIC GENERAL Section 2.0 of this manual is written to describe the general (non-technology specific)	Original	PDF	02-JUN-1997 210XXX 710-010-XX 40F-400-0-0 TM2004 MIL-STD-883 method 5003 TM1011 ACT-R01 54XXXX 40F-701-1-15 marking 25b harris top marking product change notification Harris top marking
Elmwood Sensors 3100 Abstract: Elmwood Sensors 3001 rcr07G Elmwood Sensors raychem mtc 100 connector catalog 1308940 raychem specification PPS 3010 CTA-0022 emi rfi filter raychem ce-1605900 Text: Pin and Socket Connectors Table of Contents NANONICS Nanominiature Connectors Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5004, 5005 Strip Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5006	Original	PDF	50oses Elmwood Sensors 3100 Elmwood Sensors 3001 rcr07G Elmwood Sensors raychem mtc 100 connector catalog 1308940 raychem specification PPS 3010 CTA-0022 emi rfi filter raychem ce-1605900
rcr07G Abstract: M24308/4-11f mil spec M81714 311P407 M24308/4-12F Elmwood Sensors 3100 mil spec M81714 splice M24308/2-12F 311P409 311P407-6S-B-12 Text: Pin and Socket Connectors Table of Contents NANONICS Nanominiature Connectors Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5004, 5005 Strip Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5006	Original	PDF
Z0840004PSC Abstract: Z0853006PSC sumitomo crm1033b Sumitomo CRM 1033B Z84C008 z0840004 Z0847004PSC Z0843006PSC Z0843004PSC Z84C3006PEC Text: ZiLOG, Inc. 2H - Year 2002 Quality And Reliability Report ZAC03-0004 ZiLOG 2002Quality and Reliability Report Chapter Title and Subsection TABLE OF CONTENTS Chapter Title and Subsection Chapter 1 - ZiLOG’s Quality Culture Reliability And Quality Assurance Policy Statement………………………………. 1 - 1	Original	PDF	ZAC03-0004 2002Quality Z0840004PSC Z0853006PSC sumitomo crm1033b Sumitomo CRM 1033B Z84C008 z0840004 Z0847004PSC Z0843006PSC Z0843004PSC Z84C3006PEC

tsmc 0.35um 2p4m cmos Abstract: K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC Text: Quality And Reliability Report 2004 Period Covered: 2003	Original	PDF	DC04-0001 tsmc 0.35um 2p4m cmos K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC
HMXR-5001 Abstract: 13001 YF 09 TRANSISTOR HP 5082 7000 5082-0825 33150A 2N6838 Hxtr 3101 Hxtr 3101 transistor 5082-2815 hsch-1001 Text: For Complete . Application &Sales . '. Information ' ,.' • Call ' Joseph Masarich Sales Representative HEWLETT PACKARD . NEELY "Sales Region 3003 scon BLVD. SANTA CLARA, CA 95050 408 988-7234 Microwave Semiconductor Diode and Transistor Designers Catalog	Original	PDF
LTC MTBF Abstract: transistor A110 transistor j-fet 245c transistor A113 MIL-STD-690 transistor mark code 3015 up board exam date sheet 2012 in-process quality inspections 690B A113 Text: RELIABILITY ASSURANCE RELIABILITY ASSURANCE PROGRAM INTRODUCTION In 1981 Linear Technology Corporation was founded with the intention of becoming a world leader in high performance analog semiconductors. To achieve this goal Linear Technology Corporation committed itself	Original	PDF	MIL-STD-883 5000ppm LTC MTBF transistor A110 transistor j-fet 245c transistor A113 MIL-STD-690 transistor mark code 3015 up board exam date sheet 2012 in-process quality inspections 690B A113
transistor A113 Abstract: 400X 690B A102-B A110 A113 INCOMING RAW MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION report transistor a110 DATAPACK/RHFLVDS31AD2V Text: RELIABILITY ASSURANCE PROGRAM RELIABILITY ASSURANCE PROGRAM INTRODUCTION In 1981 Linear Technology Corporation was founded with the intention of becoming a world leader in high performance analog semiconductors. To achieve this goal Linear Technology Corporation committed itself	Original	PDF	MIL-STD-883 5000ppm transistor A113 400X 690B A102-B A110 A113 INCOMING RAW MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION report transistor a110 DATAPACK/RHFLVDS31AD2V
method 2010 checklist Abstract: 88C681 68C681 L-567 88C681 equivalent L567 Text: MILITARY PRODUCTS DOCUMENTATION SYSTEMS Documentation System s also reviews customer specifications and purchase orders and generates customized internal travelers to assure compliance to customer requirements. Documentation Systems maintains a program to	OCR Scan	PDF	68C681, 88C681, 82C684 method 2010 checklist 88C681 68C681 L-567 88C681 equivalent L567
TRANSISTOR si 6822 Abstract: LM 3140 si 6822 transistor transistor 6822 si transistors Si 6822 lm3140 SN-72500 transistors br 6822 Siemens technische transistor 6823 Text: Technische Erläuterungen SIEMENS Allgem eines O ptoelektronische Bauelem ente haben in der m odernen Elektronik und dam it in fast allen Bereichen unseres Lebens weiten Eingang gefunden. Sie sind in hohem Maße an dem Um stellungsprozeß von Mechanik auf Elektronik beteiligt und haben, aufgrund ihrer Funktion als	OCR Scan	PDF
MP 1009 es Abstract: BS-00001 Text: ^EDI B c e tro n lc D e s ig n i Inc. Reliability Program Quality Assurance Policy The Quality Standard at Electronic Designs Incorpo rated EDI is defect free work. No other standard is acceptable. This policy is reflected in the attention given to the	OCR Scan	PDF	MIL-STD-883. MIL-STD-883 MP 1009 es BS-00001
Untitled Abstract: No abstract text available Text: *7 0 / 4N54 Hermetic Hexadecimal Display With Logic Texas Optoelectronics, Inc. DESCRIPTION A hermetically sealed solid-state hexadecimal display with on-board memory latch, decoder and driver. The 4N54 decodes positive 8421 BCD logic inputs and displays the appropriate hexadecimal character	OCR Scan	PDF	MIL-D-87157 000D524
4N54TXV Abstract: 4N54TXVB 4x7 DISPLAY 4N54 PM 1027 MIL-D-87157 MSI MS-5 hexadecimal display method d 1071 4N54TX Text: TEXAS OP TO E L E C T R O N I C S INC IDE D \| 3 ^ 3 ^ 3 4 OOOOlt,? S I 1 4N54 Hermetic Hexadecimal Display With Logic L -m f // * Te*asaptoe/ectron/cS, inc. F - n ' 3 & 7 - y / - 3 7 A hermetically sealed solid-state hexadecimal display with on-board memory latch, decoder and ariver.	OCR Scan	PDF	MIL-D-87157 MIL-STD-883 4N54TXV 4N54TXVB 4x7 DISPLAY 4N54 PM 1027 MSI MS-5 hexadecimal display method d 1071 4N54TX
MSD2353 Abstract: 0D570 mpc 21-37 MSD2353TXV DIODE 2141 Text: SIEMENS AKT IEN GESELLSCHAF SIEMENS 4?E D ñP3ShDS 0GE70ED 1 ISIEG MSD2351TXV/TXVB high EFF. RED MSD2352TXV/TXVB HIGH EFF. GREEN MSD2353TXV/TXVB YELLOW Sunlight Viewable .200" 4-Character 5x7 Dot Matrix Serial Input Alphanumeric Military Display Package Dimensions in Inches mm	OCR Scan	PDF	0GE70ED MSD2351TXV/TXVB MSD2352TXV/TXVB MSD2353TXV/TXVB P4\-37 MSD235X MSD2351 MSD2353 0D570 mpc 21-37 MSD2353TXV DIODE 2141

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MIL-STD-883-METHOD 2016 Search Results

MIL-STD-883-METHOD 2016 Result Highlights (5)

MIL-STD-883-METHOD 2016 Datasheets Context Search

INCOMING RAW MATERIAL INSPECTIONs

INCOMING RAW MATERIAL INSPECTION method

JESD22-A108-A

68LC060

F98S

MH1RT

51V019S-33WN

atmel MSL 1

4n54txvb

40F-701-1-15

TM2004

Elmwood Sensors 3100

rcr07G

Z0840004PSC

tsmc 0.35um 2p4m cmos

HMXR-5001

LTC MTBF

transistor A113

method 2010 checklist

TRANSISTOR si 6822

MP 1009 es

Untitled

4N54TXV

MSD2353