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Sensata Circuit Breakers JTEP-2-31286-400 Circuit Breakers
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P23128 Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
dallas date code ds12887 Abstract: dallas date code P23073 DS1225A DALLAS DS80C320 9832 P23403 dallas date code ds80c320 P23074 Text: RELIABILITY MONITOR STRESS: ULTRASOUND CONDITIONS: J-STD-020 MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. PACKAGE DS1233 A5 JAN 99 P23064 9842 CARSEM DM823017AB SOT-223 DS1803 A2 NOV 98 P22797 9833 CHIPPAC, KOREA DS1869 A3 MAR 99 P23360	Original	J-STD-020 DM823017AB DS1233 DS1803 DS1869 DS2109 DS2153 DS2175 DS5002 P23064 dallas date code ds12887 dallas date code P23073 DS1225A DALLAS DS80C320 9832 P23403 dallas date code ds80c320 P23074	PDF
DS87520 Abstract: P2305 P23855 Text: RELIABILITY MONITOR DS1000M-100 JAN '99 MONITOR-HYUNDAI,CHINA DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1000 E3 DH833179ADA 8 PIN PDIP CHIPPAC, CHINA CPS 9847 PROCESS Single Poly, Single Metal 1.2 µm Standard Process JOB NO DESCRIPT Cf: 60%	Original	DS1000M-100 DS1000 DH833179ADA P23057 P23178 DN825394AAB P23415 P23306 P23307 J-STD-020 DS87520 P2305 P23855	PDF
DS87520 Abstract: dm8304 P2271 DS2165Q Text: RELIABILITY MONITOR DS1232L OCT '98 MONITOR-HYUNDAI,KOREA DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1232L C1 DL817678ABB 8 PIN SOIC CHIPPAC, KOREA 9830 PROCESS Single Poly, Single Metal 0.8 µm Standard Process JOB NO DESCRIPT Cf: 60% Ea: 0.7	Original	DS1232L DL817678ABB P22755 P22778 J-STD-020 DS87520 DN825394AAB DS87C520 P23306 dm8304 P2271 DS2165Q	PDF
TSOC 6 Abstract: P22713 P23162 dallas date code ds12887 Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: +85°C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY DS1620 D1 SEP 98 P22710 9746 LOT NO. PACKAGE ALPHTK-BANGKOK NSEB DJ711527ABD 8PN SOIC, 208MIL READ POINT QTY FAIL 50 42	Original	DS1620 P22710 DJ711527ABD 208MIL J-STD-020 DS1232L DS1233 DS1267 TSOC 6 P22713 P23162 dallas date code ds12887	PDF
Untitled Abstract: No abstract text available Text: fjm IMP23064 P23128 IMP23256 IMP23512 23000 Series ROMS IMP23100 IMP23101 IMP23201 IMP23401 HIGH PERFORMANCE BYTE ORGANIZED ROMS Features • Eight JEDEC Standard Versions: IM P 23064 IM P23128 IM P 23256 IM P23512 IM P23100 IMP23101 IMP23201 IMP23401 28	OCR Scan	IMP23064 IMP23128 IMP23256 IMP23512 IMP23100 IMP23101 IMP23201 IMP23401 P23128 P23512	PDF
PZ3128-S10 Abstract: 0H10- 53 Text: Philips Semiconductors Product specification 128 macrocell CPLD PZ3128 FEATURES Table 1. PZ3128 Features • Industry's first TotalCMOS PLD - both CMOS design and. process technologies PZ3128 Usable gates 4000 • Fast Zero Power FZP™ design technique provides ultra-low	OCR Scan	PZ3128 100j-G3 I/0-G11 I/0-G12 I/0-G13 I/0-H10 I/0-H11 I/0-H12 I/0-H13 I/0-H15 PZ3128-S10 0H10- 53	PDF
Untitled Abstract: No abstract text available Text: Preliminary specification Philips Semiconductors 128 macrocell CPLD with enhanced clocking PZ3128A/PZ3128D FEATURES DESCRIPTION • Industry’s first TotalCMOS PLD - both CMOS design and process technologies The PZ3128A/PZ3128D CPLD Complex Programmable Logic	OCR Scan	PZ3128A/PZ3128D 50MHz -Std-883C 100-pin 128-pin	PDF