actel 14100
Abstract: A1020B
Text: v3.0 RadTolerant FPGAs Fe a t ur es Gener al C har act er is t ics • 100% Resource Utilization with 100% Pin-Locking • Tested Total Ionizing Dose TID Survivability Level • Secure Programming Technology Prevents Reverse Engineering and Design Theft
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
actel 14100
A1020B
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RT14100A
Abstract: rt1280 VKS FPGA CQFP 172 RT1280A CQFP 172 PIN 172-PIN A1280A VKS RT1460 VKS FPGA CQFP 106 A1020B
Text: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
RT14100A
rt1280
VKS FPGA CQFP 172
RT1280A
CQFP 172 PIN
172-PIN
A1280A VKS
RT1460
VKS FPGA CQFP 106
A1020B
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Cqfp256
Abstract: RQFP240 SI-EX-TCA Act2 FPGA CQFP 172 A1280A SDO RQFP208 06M7374 ACTEL A42MX09 PQFP208 RT1280A
Text: Silicon Explorer II User's Guide Actel Corporation, Mountain View, CA 94043-4655 2003 Actel Corporation. All rights reserved. Printed in the United States of America Part Number: 5029134-1 No part of this document may be copied or reproduced in any form or by any means without
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ACT1/40MX
Cqfp256
RQFP240
SI-EX-TCA
Act2 FPGA CQFP 172
A1280A SDO
RQFP208
06M7374
ACTEL A42MX09
PQFP208
RT1280A
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actel cqfp 84
Abstract: A1010B ACTEL FBGA 144
Text: v3.0 Package Options: User I/Os per Package C om m e r c i a l / I nd us t r i a l D ev i c e s A54SX16 A54SX16P A54SX32 130 175 175 174 81 81 81 A54SX08 A54SX72A SX A54SX32A A54SX16A 44 A54SX08A PLCC SX-A eX256 Pins eX128 Package eX64 eX 68 84 PQFP 69 100
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A54SX08A
A54SX16A
A54SX32A
A54SX72A
A54SX08
A54SX16
A54SX16P
A54SX32
eX128
eX256
actel cqfp 84
A1010B
ACTEL FBGA 144
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ACT1020
Abstract: JH05 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR 44 pin actel 1020b JEDEC-A113 ACTEL 1020B ACP55 smd U1p Jl03 JL-03
Text: Quality & Reliability Guide February 2001 2001 Actel Corporation All Rights Reserved. Actel and the Actel logo are trademarks of Actel Corporation. All other brand or product names are the property of their respective owners. Contents 1. Overview of Actel’s Quality and Reliability Guide . . . . . . . . . . . . . . . . . . . .1
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LM95A
Abstract: transistor a1020 Actel A1020 ACTEL A1010 Actel a1280 LM95 A1020 transistor actel a1020b ACTEL A1280A RT14100
Text: RADIATION PERFORMANCE OF ACTEL PRODUCTS J.J. Wang Technology Development Actel Corporation 408-522-4576 [email protected] Rev7 November 8, 2000 1 I. TOTAL IONIZING DOSE (TID) PERFORMANCE Table I list the TID data of Actel products published in the open domain. Also included is the availability of each product.
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98-CJ4-009,
RAD97]
LM95A
transistor a1020
Actel A1020
ACTEL A1010
Actel a1280
LM95
A1020 transistor
actel a1020b
ACTEL A1280A
RT14100
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QFN108
Abstract: QFN-132 kl1-v1 208 pin rqfp drawing qfn132 RT3PE3000L CQ256 DIMENSIONS pqfp 100 actel package mechanical drawing Actel A40MX04 PBGA 23X23 0.8 pitch
Text: v 11. 2 Package Mechanical Drawings Ceramic Pin Grid Array 84-Pin CPGA Top View 0.050" ± 0.010" Pin #1 ID 0.045" 0.055" 0.015" 0.018" ± 0.002" 0.100" BSC 1.100" ± 0.020" square 0.072" 0.088" L 0.120" 0.140" Side View K J H G F 1.000" BSC E D C B A 1 2 3
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84-Pin
A1010B
A1020B
100-Pin
QFN108
QFN-132
kl1-v1
208 pin rqfp drawing
qfn132
RT3PE3000L CQ256
DIMENSIONS pqfp 100
actel package mechanical drawing
Actel A40MX04
PBGA 23X23 0.8 pitch
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RT54SX72SCQ208
Abstract: A42MX16 RT54SX32S-CQ208 CQ208 CQ256
Text: v3.0 Component Selector Guide PCI 5.0 Volt Tolerant — 5 Volt I/O — Yes Yes Yes — — Yes 3.3 Volt I/O 3,000 2.5 Volt I/O Gates 36 JTAG I/O User I/O C, I SRAM Bits Screening –F, Std, –P Wide Decodes Speed Grade CS49 Flip-Flops/Dedicated Max Package
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CS128
TQ100
eX128
eX256
CS180
A54SX08A
RT54SX72SCQ208
A42MX16
RT54SX32S-CQ208
CQ208
CQ256
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A1010B
Abstract: Actel a54sx72a tid A54SX72A TID
Text: Actel FPGAs for Aerospace Applications When Failure is not an Option As a leading supplier of high reliability FPGAs, Actel offers programmable logic devices for a variety of high reliability applications ranging from commercial aviation and extreme environments to military
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1-888-99-ACTEL
A1010B
Actel a54sx72a tid
A54SX72A TID
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RT54SX72SCQ208
Abstract: rt1280 RT54SX32S-CQ208 RTSX72 RT1020-CQ84B aircraft logic gates RTSX72S RT1425 RT14100 RH1020-CQ84V
Text: Civilian/Scientific Exploration Actel FPGAs for Space Applications Uncompromising in the Extreme Deep Space I Device Speed Grade Gates Logic Modules Available I/Os DSCC SMD Mars Surveyor RadHard RH1020-CQ84V Std 4,000 547 69 5962F90965 RH1280-CQ172V Std 16,000
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RH1020-CQ84V
RH1280-CQ172V
RH54SXxx-CQ256V
5962F90965
5962F92156
RT54SX16-CQ208
RT54SX16-CQ256
E1020
RH1280
RH1280
RT54SX72SCQ208
rt1280
RT54SX32S-CQ208
RTSX72
RT1020-CQ84B
aircraft logic gates
RTSX72S
RT1425
RT14100
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RT54SX32S-CQ208B
Abstract: RT54SX72SCQ208 RT1280A-CQ172 Actel A1020B RT54SX16S-CQ256B 30-80LET Single Event Latchup FPGA
Text: Actel FPGAs for Space Applications Uncompromising in the Extreme n n n n n Total Dose Capabilities from 5Krads to 1M rad Latch-up Immune Device Capacities from 4,000 to 72,000 Available Gates Highly Reliable, Non-Volatile Antifuse Technology Meets the Most Stringent Quality
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1-888-99-ACTEL
RT54SX32S-CQ208B
RT54SX72SCQ208
RT1280A-CQ172
Actel A1020B
RT54SX16S-CQ256B
30-80LET
Single Event Latchup FPGA
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RT1280A
Abstract: actel a1020b A1425A 2284r RT14100A CQFP 172 PIN A1020B
Text: v 3. 0 RadTolerant Field Programmable Gate Arrays Features General Characteristics • Tested Total Ionizing Dose TID Survivability Level • No Single Event Latch-up Below a Minimum LET Threshold of 80 MeV-cm2/mg for All RT Devices • Packages: 84-Pin, 132-Pin, 172-Pin, 196-Pin, and 256-Pin
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
RT1280A
actel a1020b
A1425A
2284r
RT14100A
CQFP 172 PIN
A1020B
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13001 s
Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
Text: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2
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1225XL,
1240XL,
1280XL,
A1415,
A1425,
14100BP,
32140DX,
32200DX
13001 s
13001 datasheet
13001
JL-01
ACTEL 1020B
RTSX32
B 13001
RTSX16
42MX09
1280A
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CQFP 256 PIN actel
Abstract: RT1280A A1280A VKS rt1280 A1020B ACTEL A1280A A1020 transistor A1280A-CQ172C RT1460 actel 172 cqfp
Text: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
CQFP 256 PIN actel
RT1280A
A1280A VKS
rt1280
A1020B
ACTEL A1280A
A1020 transistor
A1280A-CQ172C
RT1460
actel 172 cqfp
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actel cqfp 84
Abstract: actel a1020b RT1425A actel a1010b actel 172 cqfp
Text: Package Options: User I/Os per Package January 1999 1999 Actel Corporation 1 Commercial/Industrial Devices RQFP VQFP TQFP BGA CPGA CQFP 129 172 172 125 176 34 57 69 69 72 83 72 72 57 125 125 152 125 176 176 202 176 176 202 57 78 112 129 78 144 78 112 144
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A54SX16P
A42MX09
A54SX08
A54SX16
A54SX32
A42MX16
A42MX24
A42MX36
A32100DX
A40MX02
actel cqfp 84
actel a1020b
RT1425A
actel a1010b
actel 172 cqfp
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CQ256
Abstract: CQ208 CQ84 A32200DX PG176 RH1020B CQ196 CI624 A42MX36 dimensions A1240XL
Text: Actel Hermetic Package Mechanical Cavity, weight, Lid size and Heat Sink size configuration Package Devices Cavity CQ84 CQ84 CQ84 CQ84 A1020B RT1020B RH1020B A32100DX Up Up Up Up Weight (grams) 2.2 2.2 2.2 2.2 Lid (mils) 520x520 520x520 520x520 550x550 Head Sink
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CQ132
CQ172
CQ196
CQ208
CQ256
CQ84
A32200DX
PG176
RH1020B
CI624
A42MX36 dimensions
A1240XL
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CQFP 256 PIN actel
Abstract: ACTEL A1280A
Text: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
CQFP 256 PIN actel
ACTEL A1280A
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Untitled
Abstract: No abstract text available
Text: RadTolerant Field Programmable Gate Arrays Features • Programming Technology Prevents Reverse Engineering and Design Theft General Characteristics • • TestedTotal Ionizing Dose TID Survivability Level • Packages: 132-Pin, 172-Pin, 196-Pin, and 256-Pin Ceramic
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132-Pin,
172-Pin,
196-Pin,
256-Pin
CQ256,
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Untitled
Abstract: No abstract text available
Text: Æ ic te ! RadTolerant Field Programmable Gate Arrays - m Features • Programming Technology Prevents Reverse Engineering and Design Theft General Characteristics • • TestedTotal Ionizing Dose TID Survivability Level • Packages: 132-Pin, 172-Pin, 196-Pin, and 256-Pin Ceramic
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132-Pin,
172-Pin,
196-Pin,
256-Pin
CQ172
CQ196
CQ256
CCS08and
CQ256,
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Untitled
Abstract: No abstract text available
Text: Æ ic t e ! v 3 .0 - m RadTolerant Field Programmable Gate Arrays Features • 100%Resource Utilization with 100%Pin-Locking General Characteristics • Secure Programming Technology Pre\ents Reverse Engineering and Design Theft
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
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CQ256
Abstract: CQ208 4PMX 4pm smd
Text: te /e • / Speed Grade JTAG I/O 3.3 Volt 5 Volt PCI 5.0 Volt Tolerant at 3.3V VQ100 Std, - 1 , - 2 , - 3 129 8,000 256 512 - — Yes Yes — — Yes PQ208 Std, - 1 , - 2 , - 3 129 8,000 256 512 — — Yes Yes — — Yes TQ144 Std, - 1 , - 2 , - 3 129 8,000
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A54SX08
VQ100
PQ208
TQ144
TQ176
1P1280A
RP14100A
RT1020
RT1280A
RT1425A
CQ256
CQ208
4PMX
4pm smd
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RT1280A-CQ172E
Abstract: RT1280A-CQ172 RT1280A
Text: RadTolerant Field Programmable Gate Arrays F e a tu re s • Secure Programming Technology Engineering and Design Theft G e n e r a l C h a r a c te r is t ic s Prevents Reverse • Permanently Programmed for Instantaneous Operation on Power-Up • Tested Total Ionizing Dose TID Survivability Level
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132-Pin,
172-Pin,
196-Pin,
256-Pin
RT14100A,
A14100A
RT1280A-CQ172E
RT1280A-CQ172
RT1280A
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