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    STD 357 Search Results

    STD 357 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    DE6B3KJ151KA4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ471KB4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6E3KJ152MN4A Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ101KA4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ331KB4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd

    STD 357 Datasheets (5)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    STD3575 Unknown Semiconductor Master Cross Reference Guide Scan PDF
    STD3576 Unknown Semiconductor Master Cross Reference Guide Scan PDF
    STD3577 Unknown Semiconductor Master Cross Reference Guide Scan PDF
    STD3578 Unknown Semiconductor Master Cross Reference Guide Scan PDF
    STD3579 Unknown Semiconductor Master Cross Reference Guide Scan PDF

    STD 357 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Untitled

    Abstract: No abstract text available
    Text: VSC7306 Data Sheet FEATURES • Full-duplex flow control IEEE Std 802.3x • Flexible link aggregation based on IEEE Std 802.3ad • 32-bit standard parallel CPU interface for SNMP and Web-based management 8 k MAC addresses and 4 k VLAN support (IEEE Std 802.1Q)


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    PDF VSC7306 32-bit VMDS-10077

    electrical power system

    Abstract: IEEE STD 1100-1999 abstract for grounding electrical system maintenance practices
    Text: IEEE Std 1100-1999 Revision of IEEE Std 1100-1992 IEEE Recommended Practice for Powering and Grounding Electronic Equipment Sponsor Power Systems Engineering Committee of the Industrial and Commercial Power Systems Department of the IEEE Industry Applications Society


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    PDF

    MS27212

    Abstract: MIL-T-55155 D1277B MS25036-102 MS25435 MS27429 MS20659-126 MIL-T-16366 M81824 MIL-T-15659
    Text: MIL-STD-l277B 28 December 1983 SUPERSEDING MIL-S- D-1277A 22 Ju’y 1970 MILITARY STANDARD SPLICES, TERMINALS, TERMINAL BINDING POSTS, TERMINAL JUNCTION SYSTEMS, WIRE CAPS; ELECTRICAL BOARDS, MIL-STD-1277B I EPARTMENTOF I)EF13NSI: WASI{INGTON. D.C. ‘20301


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    PDF MIL-STD-l277B D-1277A MIL-STD-1277B EF13NSI: MIL-STD-12773 MIL-T-7928" 277r3 MS25274 MS27212 MIL-T-55155 D1277B MS25036-102 MS25435 MS27429 MS20659-126 MIL-T-16366 M81824 MIL-T-15659

    implement AES encryption Using Cyclone II FPGA Circuit

    Abstract: EP2S15 EP2S180 EP2S30 EP2S60 EP2S90
    Text: 3. Configuration & Testing SII51003-4.2 IEEE Std. 1149.1 JTAG BoundaryScan Support All Stratix II devices provide Joint Test Action Group JTAG boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed either before


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    PDF SII51003-4 implement AES encryption Using Cyclone II FPGA Circuit EP2S15 EP2S180 EP2S30 EP2S60 EP2S90

    EPCS128

    Abstract: EPCS64 SRUNNER
    Text: 3. Configuration & Testing SIIGX51005-1.3 IEEE Std. 1149.1 JTAG BoundaryScan Support All Stratix II GX devices provide Joint Test Action Group JTAG boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed either before


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    PDF SIIGX51005-1 EPCS128 EPCS64 SRUNNER

    CDF Series capasitor

    Abstract: EPCS128 EPCS64
    Text: 3. Configuration & Testing SIIGX51005-1.4 IEEE Std. 1149.1 JTAG BoundaryScan Support All Stratix II GX devices provide Joint Test Action Group JTAG boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1. You can perform JTAG boundary-scan testing either before or


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    PDF SIIGX51005-1 CDF Series capasitor EPCS128 EPCS64

    systron Donner 410

    Abstract: MIL-STD-750E Ultrasonic Atomizing Transducer systron donner accelerometer substitute diode PH 33D fastest finger first indicator synopsis emerson three phase dc motor driver service note tektronix 576 curve tracer MIL-STD-750E 1071 proximity detector sensor
    Text: The documentation and process conversion measures necessary to comply with this revision shall be completed by 20 June 2007 INCH - POUND MIL-STD-750E 20 November 2006 SUPERSEDING MIL-STD-750D 28 FEBRUARY 1995 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES


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    PDF MIL-STD-750E MIL-STD-750D systron Donner 410 MIL-STD-750E Ultrasonic Atomizing Transducer systron donner accelerometer substitute diode PH 33D fastest finger first indicator synopsis emerson three phase dc motor driver service note tektronix 576 curve tracer MIL-STD-750E 1071 proximity detector sensor

    AGX51003-1

    Abstract: AN414 AN418 AN423 EPCS128 EPCS64
    Text: 3. Configuration and Testing AGX51003-1.2 IEEE Std. 1149.1 JTAG BoundaryScan Support All ArriaTM GX devices provide Joint Test Action Group JTAG boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed either before or


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    PDF AGX51003-1 instructioPCS64, EPCS128) AN414 AN418 AN423 EPCS128 EPCS64

    embedded control handbook

    Abstract: EP1S60 EPC16 MAX1617A MAX1619 jrunner rbf
    Text: 3. Configuration & Testing S51003-1.3 IEEE Std. 1149.1 JTAG Boundary-Scan Support All Stratix devices provide JTAG BST circuitry that complies with the IEEE Std. 1149.1a-1990 specification. JTAG boundary-scan testing can be performed either before or after, but not during configuration. Stratix


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    PDF S51003-1 1a-1990 embedded control handbook EP1S60 EPC16 MAX1617A MAX1619 jrunner rbf

    MIL-STD-750E

    Abstract: 1N21B diode cc 3053 MIL-PRF-680 D65019 rectifier 2037-1 TT 2076 SAE-ARP-743 1N21B diode 1N21* Diode Detector Holder
    Text: The documentation and process conversion measures necessary to comply with this revision shall be completed by 20 June 2007 INCH - POUND MIL-STD-750E 20 November 2006 SUPERSEDING MIL-STD-750D 28 FEBRUARY 1995 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES


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    PDF MIL-STD-750E MIL-STD-750D MIL-STD-750E 1N21B diode cc 3053 MIL-PRF-680 D65019 rectifier 2037-1 TT 2076 SAE-ARP-743 1N21B diode 1N21* Diode Detector Holder

    EP2C50

    Abstract: CII51003-2 EP2C20 EP2C35 cyclic redundancy code Some Altera devices have weak pull-up resistors altera usb blaster
    Text: 3. Configuration & Testing CII51003-2.2 IEEE Std. 1149.1 JTAG Boundary Scan Support All Cyclone II devices provide JTAG BST circuitry that complies with the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed either before or after, but not during configuration. Cyclone II devices can


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    PDF CII51003-2 EP2C50 EP2C20 EP2C35 cyclic redundancy code Some Altera devices have weak pull-up resistors altera usb blaster

    GTS FC-22

    Abstract: passive Infrared-Sensor IC 566 function generator an 503 hall sensor model railway signal project IR Beacon BWF 237 maa 502 BP 109 ir sensor datasheet ofdm modulator ic
    Text: IEEE Standards IEEE Std 802.15.4 -2003 802.15.4 TM IEEE Standard for Information technology— Telecommunications and information exchange between systems— Local and metropolitan area networks— Specific requirements Part 15.4: Wireless Medium Access


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    PDF 4TM-2003 SH95127 SS95127 GL-36. GTS FC-22 passive Infrared-Sensor IC 566 function generator an 503 hall sensor model railway signal project IR Beacon BWF 237 maa 502 BP 109 ir sensor datasheet ofdm modulator ic

    217F

    Abstract: DHVF2812S DVHF2803R3S DVHF2805D DVHF2805S DVHF2812D DVHF2815D DVHF2815S DVHF28512T
    Text: Fully Qualified Military Converters DVHF SERIES 20 Watts • Single, Dual & Triple Output Models • Designed To Meet MIL-STD-704A-D • Radiation Hardened Version • Patented Magnetic Isolation • Military & Space Screening Available • Hermetically Sealed


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    PDF MIL-STD-704A-D 217F DHVF2812S DVHF2803R3S DVHF2805D DVHF2805S DVHF2812D DVHF2815D DVHF2815S DVHF28512T

    FR103

    Abstract: FR107
    Text: FR103, FR107 Fast Recovery Axial Rectifiers Features: • Low forward voltage drop. • High current capability. • High reliability. • High surge current capability. DO-41 Mechanical Data: Case : Moulded plastic. Lead : Axial leads, solderable per MIL-STD-202,


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    PDF FR103, FR107 DO-41 MIL-STD-202, FR103 FR107

    diode vrrm 8000 if 7000

    Abstract: LOW FORWARD VOLTAGE DROP DIODE RECTIFIER "RECTIFIER DIODE" C 5022 diode rectifier diode super fast SF12
    Text: SF12 Super Fast Rectifier Diode Axial Features: • Low forward voltage drop. • High reliability. • High surge current capability. Mechanical Data: DO-41 Case : Moulded plastic. Lead : Axial leads, solderable per MIL-STD-202, Method 208 guaranteed. Polarity


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    PDF DO-41 MIL-STD-202, diode vrrm 8000 if 7000 LOW FORWARD VOLTAGE DROP DIODE RECTIFIER "RECTIFIER DIODE" C 5022 diode rectifier diode super fast SF12

    74FCT3574

    Abstract: SRW05
    Text: IDT54/74FCT3574/A ADVANCE INFORMATION 3.3V CMOS OCTAL D REGISTERS 3-STATE Integrated Device Technology, Inc. FEATURES: DESCRIPTION: • 0.5 MICRON CMOS Technology • ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0)


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    PDF IDT54/74FCT3574/A MIL-STD-883, 200pF, FCT3574/A IDT54/74FCT3574/3574A P20-1) D20-1) SO20-2) 74FCT3574 SRW05

    ES-99033-0001

    Abstract: X314 L399 X324
    Text: 10 NOTES• 90 27- 1. APPL. CLASS TO DIN 40040 HME -25°C/+100°C . 2. COMPATIBLE WITH MOLEX PT 90325. 3. USE WITH CABLES 28AWG STD. 26AWG STD. AND 26AWQ (69 STRANDS) SUPERFLEX. 4. TERMINATION SPECIFICATION: ES-99033-0001. 5. PRODUCT SPECIFICATION: PS-99020-0011.


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    PDF 28AWG 26AWG 26AWQ ES-99033-0001. PS-99020-0011. -x322 SDA-90327 ES-99033-0001 X314 L399 X324

    IMS1601LM

    Abstract: A12CI
    Text: IM S 1 6 0 0 M IM S 1 6 0 1 L M CMOS High Performance 64K x 1 Static RAM MIL-STD-883C FEATURES DESCRIPTION • INMOS' Very High Speed CMOS • Advanced Process -1 .6 Micron Design Rules • Full Military Temperature Operating Range -55°C to +125“C • MIL-STD-883C Processing


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    PDF 125-C) MIL-STD-883C 22-Pin, 300-mil 22-Pin IMS1600M IMS1601LM MIL-STD-883C 64Kx1 IMS1601LM A12CI

    H06X-XXX-X-14-X-X

    Abstract: .1/100V/30021
    Text: 0. 80 mm HERMAPHRODITIC CONNECTOR CENTURY INTERCONNECT PRODUCTS 800-221-3576 203-375-5344 FAX 203-375-1631 SPECIFICATION: INSULATOR MATERIAL: HIGH TEMPERATURE THERMOPLASTIC FLAMMABILITY RATING: UL94V-0 INSULATION RESISTANCE: 1000 MEGOHMS MIN. PER MIL-STD-1344A METHOD 3003.1


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    PDF UL94V-0 MIL-STD-1344A XXX-X-19-X-X H08X-XXX-X-18-X-X H0SX-XXX-X-21-X-X H06X-XXX-X-IS-X-X H08X-XXXX- H06X-XXX-X-14-X-X .1/100V/30021

    Untitled

    Abstract: No abstract text available
    Text: MICROPAC INDUSTRIES INC 30 deTJ biiamo ooooatiti a /77/f T -58-11-13 725 E, Walnut Street Garland, Texas 75040 214 272-3571 TWX 910-860-5186 MICROPAC INDUSTRIES, INC. P R E LIM IN A R Y MIVR 42079 1.5A FIXED THREE TERMINAL NEGATIVE REGULATORS Screened to Mil. Std. 883B.


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    PDF /77/f

    78HXX

    Abstract: 78HXXA 5A 5V regulator
    Text: NICROPAC IND UST RI ES INC 3D ~ DE | bliabMO □ □□□at.E 5 T-58-11-13 725 E. Walnut Street Garland, Texas 75040 214 272-3571 TWX 910-860-5186 mu MICROPAC INDUSTRIES, INC. PRELIMINARY MIVR 42059 5V - 5A HYBRID POSITIVE VOLTAGE REGULATOR S creened to M il. Std. 883B


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    PDF T-58-11-13 78HXX 78HXXA 78HXX 5A 5V regulator

    Untitled

    Abstract: No abstract text available
    Text: Product specification SlgnetlcsMilitary Microprocessor Products Enhanced programmable communications interface EPCI 68661/2661 NO TIC E: This product is non-compliant to MlL-STD-883. DESCRIPTION - 5- to 6-bit characters plus parity The Signetics 68661 EPCI is a universal


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    PDF MlL-STD-883. 16-bit

    Untitled

    Abstract: No abstract text available
    Text: GSD REVISIONS CHANGES ER 35794 MJB 09/20/94 KD Ol I O I CO 2-1543-1M27 NOTES: 1. FOR USE WITH BOEING S280W503-4 AND ADAMS RUSSELL FC28Z CABLES. 2. FOR CABLING INSTRUCTIONS SEE 3=546=2. 3. FOR CRIMPING USE DIE KTH-2212. 4. INTERFACE PER MIL-STD-348, FIG. 313=1.


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    PDF 2-1543-1M27 S280W503-4 FC28Z KTH-2212. MIL-STD-348, 1-762-10MA9) ASTM-D-4894 ASTM-B-140 ZZ-R-765 ASTM-B-196

    SJS830200

    Abstract: SJS830100 EIA-364-31
    Text: SJS830200 REV ECN APP'D 6253 JT 8 /6 /0 8 6297 JT 1/14/09 6431 ^n -7 ò {Z ìfa 7 1 HITE MARKING 0.040" HIGH CHARACTER . “ 1 -WHITE DOT .453 +.005 .010 .357 TEST REQUIREMENT TEST METHOD MIL-STD-1344 SUPERSEDED BY EIA 364 OPERATING TEMP. - 65° TO + 125° C


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    PDF SJS830200 SJS830200 SJS830100 MIL-STD-1344 ElA-364-6) EIA-364-20) EIA-364-21) MIL-DTL-55302 EIA-364-32) SJS830100 EIA-364-31