ADT-USB-PR081203001C-1
Abstract: P200A "mini usb" P200A00 mini usb
Text: 1 2 3 4 5 6 7 8 9 A A B B C C D D E F Item 1 2 3 4 5 6 7 Name JRS6-04FS7N1 P100345 P200A00 X000001 SB00600 SB00400 Description USB AF PVC PE 7*0. 12 L=50 L=2 PE: 30*60*0. 04 PE: 260*200*0. 04 Mini USB A5 E RoHS compliant Rev. F Description Date Approved G
|
Original
|
JRS6-04FS7N1
P100345
P200A00
X000001
SB00600
SB00400
ADT-USB-PR081203001C-1
ADT-USB-PR081203001C-1
P200A
"mini usb"
P200A00
mini usb
|
PDF
|
ADT-USB-PR081203001C
Abstract: P200A00 P200A mini usb
Text: 1 2 3 4 5 6 7 8 9 A A B B C C D D E F Item 1 2 3 4 5 6 7 Name JRS6-04FS7N1 P100345 P200A00 X000001 SB00600 SB00400 Description USB AF PVC PE 7*0. 12 L=50 L=2 PE: 30*60*0. 04 PE: 260*200*0. 04 Mini USB A5 E RoHS compliant Rev. F Description Date Approved G
|
Original
|
JRS6-04FS7N1
P100345
P200A00
X000001
SB00600
SB00400
ADT-USB-PR081203001C
ADT-USB-PR081203001C
P200A00
P200A
mini usb
|
PDF
|
BCT8373A
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
SCBA004C
SDYA010
SDYA012
SSYA002C,
SZZU001B,
SDYU001N,
BCT8373A
|
PDF
|
ATMEGA32U4
Abstract: 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
|
Original
|
16/32K
ATmega16U4/ATmega32U4)
512Bytes/1K
Flash/100
7766F
ATMEGA32U4
7766D
atmega16 assembly
IC ATMEGA16 power supply schematic
ATmega16 IR remote control
7766E
SP12
SP13
SP14
SP15
|
PDF
|
BCT245
Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT8245A
SN54BCT8245A
BCT245
F245
SN54BCT8245A
SN74BCT8245A
|
PDF
|
V5050
Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
|
Original
|
SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT8244A
SN54BCT8244A
17customer
V5050
BCT244
F244
SN54BCT8244A
SN74BCT8244A
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
|
Original
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT8245A
SN54BCT8245A
|
PDF
|
mitsubishi split ac
Abstract: 013A1
Text: t U de nd v e er lo pm en Preliminary Specifications REV.A Mitsubishi microcomputers Specifications in this manual are tentative and subject to change. M16C / 6NT Group SINGLE-CHIP 16-BIT CMOS MICROCOMPUTER Description Description The M16C/6NT group of single-chip microcomputers are built using the high-performance silicon gate
|
Original
|
16-BIT
M16C/6NT
M16C/60
100-pin
mitsubishi split ac
013A1
|
PDF
|
ATMEL 649v
Abstract: 6490V ATMEGA329 TWI avr adc
Text: Features • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
|
Original
|
16MHz
32KBytes
ATmega329/ATmega3290)
64KBytes
ATmega649/ATmega6490)
2552K
ATMEL 649v
6490V
ATMEGA329 TWI
avr adc
|
PDF
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
|
Original
|
SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT245
|
PDF
|
ATmega32H
Abstract: PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2
Text: Atmel ATmega32HVE2/ATmega64HVE2 8-bit AVR Microcontroller with Precise Analog Frontend for very Accurate Voltage and Current Measurement PRELIMINARY DATASHEET Features ● Single-package fully-integrated ● High precision analog frontend ● 17bit single-ended voltage-ADC
|
Original
|
ATmega32HVE2/ATmega64HVE2
17bit
SAEJ2602-2
ATmega32H
PV15100
PCIE10
atmel 718
ac chopper
ATMEGA64HVE2
|
PDF
|
PFC 5kw
Abstract: principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81
Text: Features • High performance, low power Atmel AVR® 8-bit Microcontroller • Advanced RISC architecture • • • • – 131 powerful instructions - most single clock cycle execution – 32 x 8 general purpose working registers – Fully static operation
|
Original
|
8/16Kbytes
7734Q
PFC 5kw
principle block diagram 115v 400hz power
schematic diagram 10kw bldc motor speed controller
1242 qfn32
P320 AVR
AT90PWM81
|
PDF
|
bct8240a
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
|
Original
|
SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
SNJ54BCT8240AFK
5962View
9174601Q3A
SNJ54BCT8240AJT
9174601QLA
bct8240a
|
PDF
|
|
|
mega32u4
Abstract: at90usb164 AT90USB324 Atmega32u4 SP10 SP11 SP12 SP13 SP14 SP15
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
|
Original
|
|
PDF
|
3290
Abstract: 3290PV rele 12V 10A RELE 12V 5 pines
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
|
Original
|
1149he
3290
3290PV
rele 12V 10A
RELE 12V 5 pines
|
PDF
|
ATMEGA1280-16AU
Abstract: avr 2560 atmega1280 avr 328 pc 2561 2549K-AVR-01 PJ63 TQFP64 package
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
|
Original
|
64K/128K/256K
2549K
ATMEGA1280-16AU
avr 2560
atmega1280
avr 328
pc 2561
2549K-AVR-01
PJ63
TQFP64 package
|
PDF
|
ATMEGA324PA-PU
Abstract: DRQFN 168T 1610t VATMEGA324PA 25810 oc 192 modulator atmel 1010
Text: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • – 131 Powerful Instructions – Most Single-clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
|
Original
|
|
PDF
|
mega169
Abstract: atmega169v-8ai
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
|
Original
|
2514P
mega169
atmega169v-8ai
|
PDF
|
atmega169pv-8au
Abstract: avr adc
Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation
|
Original
|
8018I
atmega169pv-8au
avr adc
|
PDF
|
0262F8
Abstract: marking TA1S INV04 p67 marking to-252
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid
|
Original
|
16-BIT
M16C/26
M16C/20
REU09B0001-0090Z
0262F8
marking TA1S
INV04
p67 marking to-252
|
PDF
|
DIODE marking CK 6CA
Abstract: DIODE marking 7BA SG 6CA 6ca DIODE code 20c 7ba Diode HP5 637 409 SG 5BA MARKING CO5 sg 7ba ai cm1 100 1e8
Text: To all our customers Regarding the change of names mentioned in the document, such as Mitsubishi Electric and Mitsubishi XX, to Renesas Technology Corp. The semiconductor operations of Hitachi and Mitsubishi Electric were transferred to Renesas Technology Corporation on April 1st 2003. These operations include microcomputer, logic, analog
|
Original
|
M306H1SFP
DIODE marking CK 6CA
DIODE marking 7BA
SG 6CA
6ca DIODE
code 20c 7ba
Diode HP5 637 409
SG 5BA
MARKING CO5
sg 7ba
ai cm1 100 1e8
|
PDF
|
SN74BCT373
Abstract: SN74BCT8373 SN74F373
Text: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and
|
Original
|
SN74BCT8373
SCBS471
SN74F373
SN74BCT373
SN74BCT8373
|
PDF
|
SN54BCT8244A
Abstract: SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal
|
OCR Scan
|
SN54BCT8244A,
SN74BCT8244A
SCBS042D
SN54/74F244
SN54/74BCT244
752S5
SN54BCT8244A
|
PDF
|
