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    JESD22-A108

    Abstract: JESD22*108
    Text: AOS Semiconductor Product Reliability Report AO3421E, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3421E. Accelerated environmental tests are performed on a specific sample size, and then followed


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    AO3421E, AO3421E. AO3421E Resul77x168 6x77x1000) JESD22-A108 JESD22*108 PDF

    JESD22-A108

    Abstract: JESD22A108 mosfet reliability testing report On semiconductor power MOSFET reliability report JEDEC htrb AO3162 MOSFET reliability report
    Text: AOS Semiconductor Product Reliability Report AO3162, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3162. Accelerated environmental tests are performed on a specific sample size, and then followed


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    AO3162, AO3162. AO3162 R77x168 6x77x1000) JESD22-A108 JESD22A108 mosfet reliability testing report On semiconductor power MOSFET reliability report JEDEC htrb MOSFET reliability report PDF

    JESD22-A108

    Abstract: JESD22A108 HTGB
    Text: AOS Semiconductor Product Reliability Report AO3402, rev E Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3402. Accelerated environmental tests are performed on a specific sample size, and then followed


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    AO3402, AO3402. AO3402 R77x168 6x77x1000) JESD22-A108 JESD22A108 HTGB PDF

    Untitled

    Abstract: No abstract text available
    Text: AOS Semiconductor Reliability Report AOT5B60D, 600V, 5A Alpha IGBT TM with Diode Rev. A ALPHA & OMEGA Semiconductor, Inc www.aosmd.com AOS Reliability Report 1 TM The Alpha IGBT line of products offers best-in-class performance in conduction and switching


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    AOT5B60D, PDF

    ao3406

    Abstract: No abstract text available
    Text: AOS Semiconductor Product Reliability Report AO3406/L, rev D Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3406/L.


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    AO3406/L, AO3406/L. AO3406/L Packax500 5x2x77x1000) 10-5eV ao3406 PDF

    AO3415A

    Abstract: FIT rate JESD22-A108
    Text: AOS Semiconductor Product Reliability Report AO3415A, rev C Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3415A. Accelerated environmental tests are performed on a specific sample size, and then followed


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    AO3415A, AO3415A. AO3415A Resul77x168 6x77x1000) FIT rate JESD22-A108 PDF

    FIT rate

    Abstract: JESD22-A108 AO3415
    Text: AOS Semiconductor Product Reliability Report AO3415, rev F Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3415. Accelerated environmental tests are performed on a specific sample size, and then followed


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    AO3415, AO3415. AO3415 R77x168 6x77x1000) FIT rate JESD22-A108 PDF

    JEDEC htrb

    Abstract: HTRB reliability report and tests for failure rate JEDEC hast 8006NS JESD 85
    Text: AOS Semiconductor Product Reliability Report AOZ8001DI, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOZ8001DI. Review of the electrical test results confirm that AOZ8001DI pass AOS quality and reliability


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    AOZ8001DI, AOZ8001DI. AOZ8001DI AOZ8001DH) 2x77x168 2x77x500) 10-5eV JEDEC htrb HTRB reliability report and tests for failure rate JEDEC hast 8006NS JESD 85 PDF

    JESD22-A108

    Abstract: JEDEC htrb JESD22A108 AO3409 JESD22A102 JESD 85
    Text: AOS Semiconductor Product Reliability Report AO3409, rev D Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3409. Accelerated environmental tests are performed on a specific sample size, and then followed


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    AO3409, AO3409. AO3409 R77x168 6x77x1000) JESD22-A108 JEDEC htrb JESD22A108 JESD22A102 JESD 85 PDF

    AO3400A

    Abstract: HTGB FIT rate
    Text: AOS Semiconductor Product Reliability Report AO3400A, rev B Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3400A.


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    AO3400A, AO3400A. AO3400A 77x168 2x2x77x500) 10-5eV HTGB FIT rate PDF

    JESD22-A108

    Abstract: JESD22A108 FIT rate JESD22*108 JESD 85
    Text: AOS Semiconductor Product Reliability Report AO3403/L, rev E Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3403/L. Accelerated environmental tests are performed on a specific sample size, and then followed


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    AO3403/L, AO3403/L. AO3403/L Rex500 2x2x77x1000) 10-5eV JESD22-A108 JESD22A108 FIT rate JESD22*108 JESD 85 PDF