JESD22-A108
Abstract: JESD22*108
Text: AOS Semiconductor Product Reliability Report AO3421E, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3421E. Accelerated environmental tests are performed on a specific sample size, and then followed
|
Original
|
AO3421E,
AO3421E.
AO3421E
Resul77x168
6x77x1000)
JESD22-A108
JESD22*108
|
PDF
|
JESD22-A108
Abstract: JESD22A108 mosfet reliability testing report On semiconductor power MOSFET reliability report JEDEC htrb AO3162 MOSFET reliability report
Text: AOS Semiconductor Product Reliability Report AO3162, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3162. Accelerated environmental tests are performed on a specific sample size, and then followed
|
Original
|
AO3162,
AO3162.
AO3162
R77x168
6x77x1000)
JESD22-A108
JESD22A108
mosfet reliability testing report
On semiconductor power MOSFET reliability report
JEDEC htrb
MOSFET reliability report
|
PDF
|
JESD22-A108
Abstract: JESD22A108 HTGB
Text: AOS Semiconductor Product Reliability Report AO3402, rev E Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3402. Accelerated environmental tests are performed on a specific sample size, and then followed
|
Original
|
AO3402,
AO3402.
AO3402
R77x168
6x77x1000)
JESD22-A108
JESD22A108
HTGB
|
PDF
|
Untitled
Abstract: No abstract text available
Text: AOS Semiconductor Reliability Report AOT5B60D, 600V, 5A Alpha IGBT TM with Diode Rev. A ALPHA & OMEGA Semiconductor, Inc www.aosmd.com AOS Reliability Report 1 TM The Alpha IGBT line of products offers best-in-class performance in conduction and switching
|
Original
|
AOT5B60D,
|
PDF
|
ao3406
Abstract: No abstract text available
Text: AOS Semiconductor Product Reliability Report AO3406/L, rev D Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3406/L.
|
Original
|
AO3406/L,
AO3406/L.
AO3406/L
Packax500
5x2x77x1000)
10-5eV
ao3406
|
PDF
|
AO3415A
Abstract: FIT rate JESD22-A108
Text: AOS Semiconductor Product Reliability Report AO3415A, rev C Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3415A. Accelerated environmental tests are performed on a specific sample size, and then followed
|
Original
|
AO3415A,
AO3415A.
AO3415A
Resul77x168
6x77x1000)
FIT rate
JESD22-A108
|
PDF
|
FIT rate
Abstract: JESD22-A108 AO3415
Text: AOS Semiconductor Product Reliability Report AO3415, rev F Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3415. Accelerated environmental tests are performed on a specific sample size, and then followed
|
Original
|
AO3415,
AO3415.
AO3415
R77x168
6x77x1000)
FIT rate
JESD22-A108
|
PDF
|
JEDEC htrb
Abstract: HTRB reliability report and tests for failure rate JEDEC hast 8006NS JESD 85
Text: AOS Semiconductor Product Reliability Report AOZ8001DI, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOZ8001DI. Review of the electrical test results confirm that AOZ8001DI pass AOS quality and reliability
|
Original
|
AOZ8001DI,
AOZ8001DI.
AOZ8001DI
AOZ8001DH)
2x77x168
2x77x500)
10-5eV
JEDEC htrb
HTRB
reliability report and tests for failure rate
JEDEC hast
8006NS
JESD 85
|
PDF
|
JESD22-A108
Abstract: JEDEC htrb JESD22A108 AO3409 JESD22A102 JESD 85
Text: AOS Semiconductor Product Reliability Report AO3409, rev D Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3409. Accelerated environmental tests are performed on a specific sample size, and then followed
|
Original
|
AO3409,
AO3409.
AO3409
R77x168
6x77x1000)
JESD22-A108
JEDEC htrb
JESD22A108
JESD22A102
JESD 85
|
PDF
|
AO3400A
Abstract: HTGB FIT rate
Text: AOS Semiconductor Product Reliability Report AO3400A, rev B Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3400A.
|
Original
|
AO3400A,
AO3400A.
AO3400A
77x168
2x2x77x500)
10-5eV
HTGB
FIT rate
|
PDF
|
JESD22-A108
Abstract: JESD22A108 FIT rate JESD22*108 JESD 85
Text: AOS Semiconductor Product Reliability Report AO3403/L, rev E Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3403/L. Accelerated environmental tests are performed on a specific sample size, and then followed
|
Original
|
AO3403/L,
AO3403/L.
AO3403/L
Rex500
2x2x77x1000)
10-5eV
JESD22-A108
JESD22A108
FIT rate
JESD22*108
JESD 85
|
PDF
|