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CY27S03A Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability	Original	CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide	PDF
CY7C9101 Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901 Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the	Original		PDF
Untitled Abstract: No abstract text available Text: CY2909A CY2911A CYPRESS SEMICONDUCTOR CMOS Micro Program Sequencers Features • • • • F a st — C Y 2 9 0 9 A /1 1 A h a s a 4 0 ns m in . c lo c k to o u tp u t c y c le tim e; co m m er cia l — C Y 2 9 0 9 /1 1 h as a 4 0 n s (m in .) c lo c k to o u tp u t c y c le	OCR Scan	CY2909A CY2911A	PDF
am2911a Abstract: CY2911APC CY2909 Text: CY2909A CY2911A CYPRESS SEMICONDUCTOR CMOS Micro Program Sequencers • Infinitely expandable in 4-bit Incre ments Features • Fast — CY2909A/I1A has a 40-ns min. clock-to-output cycle time (com mercial) — CY2909/11 has a 40-ns (min.) clock-to-output cycle time (m ili	OCR Scan	CY2909A CY2911A CY2909A/I1A 40-ns CY2909/11 AM2909A/AM2911A am2911a CY2911APC CY2909	PDF
Untitled Abstract: No abstract text available Text: CY2909A CY2911A CYPRESS SEMICONDUCTOR Features • Fast — C Y 2 9 0 9 A /llA h a sa 4 0 -n s min. clock-to-output cycle tíme (com mercial) — CY2909/11 has a 40-ns (min.) clock-to-output cycle tim e (m ili tary! • Low power — I c e (max*) = 70 mA (commercial)	OCR Scan	CY2909A CY2911A CY2909/11 40-ns AM2909A/AM2911A CY2909A CY2911A	PDF
CY7C2901 Abstract: No abstract text available Text: ÌB Ìcy p ress • Table 10. Die Sizes of Cypress Devices continued P a rt N um ber Size (mil2) P a rt N um ber Size (mil2) ECL Logic CY 2909A 7968 CY100E301L 14875 CY2910A 21750 CY100E302L 14875 CY2911A 7968 CY100E422 6960 11800 CY100E474 10830 CY7C510	OCR Scan	CY100E301L CY2910A CY100E302L CY2911A CY100E422 CY100E474 CY7C510 CY100E494 CY7C516 CY10E301L CY7C2901	PDF