arcflash
Abstract: ks fuses IEEE1584 F1959 fastcam 1307C
Text: Arc Flash Basics: Testing Update M. Lang and T. Neal Ferraz Shawmut, 374 Merrimac St, Newburyport, MA 01950, USA [email protected] Neal Associates Ltd., 106 Leetes Island Road, Guilford, CT 06437, USA [email protected] Abstract: Arc flash hazard calculations used to predict the magnitude of the heat hazard are based on tests with
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F1959/F1959M-06a
arcflash
ks fuses
IEEE1584
F1959
fastcam
1307C
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arcflash
Abstract: Ferraz Shawmut IEEE1584 fastcam plasma ignition
Text: Effect of Electrode Orientation in Arc Flash Testing R. Wilkins, M. Allison and M. Lang October 2005 Ferraz Shawmut, Inc. 374 Merrimac Street Newburyport, MA 01950-1998 USA 2006 IEEE. Reprinted from the record of the 2005 Industry Applications Conference, October 2005.
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PCIC-2004-39,
arcflash
Ferraz Shawmut
IEEE1584
fastcam
plasma ignition
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1234567890ABCDEF
Abstract: SiC semiconductors
Text: D IS TIN C TIV E C H A R A C TE R IS T IC S 128 entries of 48 bits each for storage of record tags in a Content-addressable Memory for Fully-associative caching Nibble masking allows configuring the CAM versus Associated data from 24 to 48 bits in four-bit increments
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-2-815-8536x6201
1234567890ABCDEF
SiC semiconductors
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VBO+19-16+DT1
Abstract: No abstract text available
Text: DATA DISTINCTIVE CHARACTERISTICS 128 entries of 48 bits each for storage of record tags in a Content-addressable Memory for Fully-associative caching Nibble masking allows configuring the CAM versus Associated data from 24 to 48 bits in four-bit increments
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OCR Scan
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63-2-815-8536x6201
VBO+19-16+DT1
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