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    iob25hh

    Abstract: RAM256X9AA
    Text: ProASICPLUS Macro Library Guide R1-2002 Actel Corporation, Sunnyvale, CA 94086 2002 Actel Corporation. All rights reserved. Part Number: 5579016-1 Release: June 2002 No part of this document may be copied or reproduced in any form or by any means without prior written consent of Actel.


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    R1-2002 iob25hh RAM256X9AA PDF

    OB33LN

    Abstract: IOB33LNU IOBL33LLU OB25LPLL IOBL25HHU OB33PL IOB33PH OTB33PL OB33LL
    Text: A ppl i cati on N ot e I/O Cell Selection for ProASIC 500K Devices In t ro d u c t i o n Table 1 • Input Pads The ProASIC 500K family offers a variety of different I/O cells to meet specific application requirements. These I/O cells can be configured with a 3.3V or 2.5V I/O ring supply


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    IB33U IB25U IB25LPU IB25LP OB33LN IOB33LNU IOBL33LLU OB25LPLL IOBL25HHU OB33PL IOB33PH OTB33PL OB33LL PDF

    iob25hh

    Abstract: IOB33LNU
    Text: Application Note I/O Cell Selection for ProASIC 500K Devices Introduction Table 1 • Input Pads The ProASIC 500K family offers a variety of different I/O cells to meet specific application requirements. These I/O cells can be configured with a 3.3V or 2.5V I/O ring supply voltage.


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    IB33U IB25U IB25LPU IB25LP IOB25LPLN IOB25LPLL IOBL25LPHH IOBL25LPHN IOBL25LPHL IOBL25LPLH iob25hh IOB33LNU PDF

    A500K050

    Abstract: A500K130 IB33U
    Text: Application Note AC144 Using JTAG Boundary-Scan with ProASIC 500K Devices In t ro d u c t i o n Due to the increasing complexity of circuit boards, testing loaded boards is becoming prohibitively expensive and more difficult to perform. Board complexity has resulted from the


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    AC144 A500K130BG456; A500K050 A500K130 IB33U PDF

    FIFO256X9SSRP

    Abstract: iob25hh RAM256X9AA
    Text: ProASIC Macro Library Guide November 1999 Actel Corporation, Sunnyvale, CA 94086 ã 1999 Actel Corporation. All rights reserved. Part Number: 5579016-1 Release: November 1999 No part of this document may be copied or reproduced in any form or by any means without prior


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    PDF

    IB33U

    Abstract: S148
    Text: A ppl i cati on N ot e Using JTAG Boundary-Scan with ProASIC 500K Devices In t ro d u c t i o n Due to the increasing complexity of circuit boards, testing loaded boards is becoming prohibitively expensive and more difficult to perform. Board complexity has resulted from the


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    A500K130BG456; IB33U S148 PDF

    iob25hh

    Abstract: No abstract text available
    Text: ProASIC Macro Library Guide June 1999 Actel Corporation, Sunnyvale, CA 94086 ã 1999 Actel Corporation. All rights reserved. Part Number: 5579016-0 Release: June 1999 No part of this document may be copied or reproduced in any form or by any means without prior


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    PDF

    AC142

    Abstract: IOB33PH IOB33PNU OTB33PL IOB33LL ob33lh OTB33PH
    Text: Application Note AC142 I/O Cell Selection for ProASIC 500K Devices In t ro d u c t i o n Table 1 • Input Pads The ProASIC 500K family offers a variety of different I/O cells to meet specific application requirements. These I/O cells can be configured with a 3.3V or 2.5V I/O ring supply


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    AC142 AC142 IOB33PH IOB33PNU OTB33PL IOB33LL ob33lh OTB33PH PDF