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    MDS 40-16

    Abstract: 4511 3510 70-088 National Semiconductor 4558 144049 S6C9639 82347
    Text: Military/Aerospace Analog Engineering N TOTAL DOSE RADIATION TEST I. INTRODUCTION Total dose radiation tests are designed to characterize changes in device performance due to total dose radiation. These tests are not intended to classify maximum radiation


    Original     		PDF MIL-STD-883 compli436 LM2595J-5 MDS 40-16 4511 3510 70-088 National Semiconductor 4558 144049 S6C9639 82347